Mode‐synthesizing atomic force microscopy for volume characterization of mixed metal nanoparticles

Vitry, Pauline; Bourillot, Eric; Tetard, Laurene; Plassard, Cédric; Lacroute, Y.; Lesniewska, Éric

doi:10.1111/jmi.12398

Cited by 4 publications

(1 citation statement)

References 25 publications

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“…Based on the assumptions described in the model, a crude tomography representation of the sample could be constructed from the data acquired at the difference mode varied from a few kHz to several hundred kHz. Vitry et al exploited this idea in several reports [120,123,124].…”

Section: Multifrequency Afmmentioning

confidence: 99%

Nanoscale subsurface imaging

Soliman

Ding

Tetard

2017

J. Phys.: Condens. Matter

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The ability to probe structures and functional properties of complex systems at the nanoscale, both at their surface and in their volume, has drawn substantial attention in recent years. Besides detecting heterogeneities, cracks and defects below the surface, more advanced explorations of chemical or electrical properties are of great interest. In this article, we review some approaches developed to explore heterogeneities below the surface, including recent progress in the different aspects of metrology in optics, electron microscopy, and scanning probe microscopy. We discuss the principle and mechanisms of image formation associated with each technique, including data acquisition, data analysis and modeling for nanoscale structural and functional imaging. We highlight the advances based on atomic force microscopy (AFM). Our discussion first introduces methods providing structural information of the buried structures, such as position in the volume and geometry. Next we present how functional properties including conductivity, capacitance, and composition can be extracted from the modalities available to date and how they could eventually enable tomography reconstructions of systems such as overlay structures in transistors or living systems. Finally we propose a perspective regarding the outstanding challenges and needs to push the field forward.

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Section: Multifrequency Afmmentioning

confidence: 99%

Nanoscale subsurface imaging

Soliman

Ding

Tetard

2017

J. Phys.: Condens. Matter

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Emerging multi-frequency surface strain force microscopy

Zeng

Sim

Yong

et al. 2023

Journal of Applied Physics

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During the past decade, Scanning Probe Microscopy (SPM) based surface strain detection techniques have been extensively used in the characterization of functional materials, structures, and devices. Here, we refer these techniques as Surface Strain Force Microscopy (SSFM), which mainly includes the Piezoresponse Force Microscopy, Atomic Force Acoustic Microscopy, Atomic Force Microscopy-Infrared spectroscopy (or photothermal induced resonance), Piezomagnetic Force Microscopy, and Scanning Joule Expansion Microscopy. The inception of SSFM opens up a pathway to study the nanoscale physical properties by using a sharp tip to detect the local field-induced surface strain. Through measuring the signals of the surface strain, multiple physical properties, such as the electromechanical, mechanical, photothermal, magnetic, thermoelastic properties, can be characterized with an unprecedented spatial resolution. In order to further develop and overcome the fundamental issues and limitations of the SSFM, the multi-frequency SPM technology has been introduced to the SSFM-based techniques, leading to the emerging of multi-frequency SSFM (MF-SSFM). As a technical breakthrough of the SSFM, MF-SSFM has demonstrated substantial improvements in both performance and capability, resulting in increased attentions and numerous developments in recent years. This Perspective is, therefore, aimed at providing a preliminary summary and systematic understanding for the emerging MF-SSFM technology. We will first introduce the basic principles of conventional SSFM and multi-frequency SPM techniques, followed by a detailed discussion about the existing MF-SSFM techniques. MF-SSFM will play an increasingly important role in future nanoscale characterization of the physical properties. As a result, many more advanced and complex MF-SSFM systems are expected in the coming years.

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