2012
DOI: 10.1088/0022-3727/45/6/065303
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Microscopic mechanism for unipolar resistive switching behaviour of nickel oxides

Abstract: A microscopic mechanism for the unipolar resistive switching phenomenon in nickel oxides is proposed based on the thermal decomposition of oxygen ions from oxygen-rich clusters and their recombination with electron-depleted vacancies induced by local electric field in conductive filaments. The proposed physical feature is confirmed by x-ray photoelectron spectroscopy, transmission electron microscopy and electrical measurements in the as-deposited NiO x samples. The dedu… Show more

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Cited by 127 publications
(74 citation statements)
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“…Figure 5d shows the relationship between the real part of the impedance spectra ( Z re ) and ω −1/2 (where ω is the angular frequency in the low frequency region, ω = 2 πf ) in the low-frequency region after 100 cycles. The lower slope ( σ , Warburg impedance coefficient) of the real part of the impedance spectra ( Z re ) versus ω −1/2 for the Co 2 (OH) 3 Cl powder electrode reveals a higher lithium-ion diffusion rate than CoO and CoCl 2 (H 2 O) 2 powder electrodes525354. Figure 6 shows the morphologies of the Co 2 (OH) 3 Cl powders obtained after 100 th charging process.…”
Section: Resultsmentioning
confidence: 99%
“…Figure 5d shows the relationship between the real part of the impedance spectra ( Z re ) and ω −1/2 (where ω is the angular frequency in the low frequency region, ω = 2 πf ) in the low-frequency region after 100 cycles. The lower slope ( σ , Warburg impedance coefficient) of the real part of the impedance spectra ( Z re ) versus ω −1/2 for the Co 2 (OH) 3 Cl powder electrode reveals a higher lithium-ion diffusion rate than CoO and CoCl 2 (H 2 O) 2 powder electrodes525354. Figure 6 shows the morphologies of the Co 2 (OH) 3 Cl powders obtained after 100 th charging process.…”
Section: Resultsmentioning
confidence: 99%
“…In the physical mechanism, 1) the conduction is due to electron hopping transport through The calculations on the electron-depletion in V o [10] and Joule heating controlled thermal releasing of O 2-from the easy-reduction clusters [11] as described in the unified mechanism supported the predictions of the unified physical mechanism. The measured data of HfOx-based RRAM devices showed that both hopping (semiconductinglike) and metallic-like conduction behaviors can be observed in the devices under different SET current compliances as shown in Fig.2(a)&(b) [7].…”
Section: Unified Physical Mechanismmentioning
confidence: 74%
“…6a and 6b are XPS Ni 2p spectra of RGO/Ni and RGO/glu/Ni, demonstrating the existence of Nickel oxide components again. The Ni 2p 3/2 peaks appeared at 856 and 854 eV, respectively, indicating two kinds (Ni 2 O 3 and NiO) of nickel oxide formed [22]. Although no evidence of Ni 2 O 3 was found in XRD, it could also be created with NiO through the annealing simultaneously.…”
Section: Resultsmentioning
confidence: 95%