Method for integrated circuits total ionizing dose hardness testing based on combined gamma- and x-ray irradiation facilities

Abstract

A method is proposed to test microelectronic parts total ionizing dose hardness based on a rationally balanced combination of gamma-and X-ray irradiation facilities. The scope of this method is identified, and a step-by-step algorithm of combined testing is provided, along with a test example of the method application.

Hardware-Software Complex for Functional and Parametric Tests of ARM Microcontrollers STM32F1XX

“…Seven MCU samples were tested in different applications and environment conditions by using this complex [13][14][15]. Some test results obtained by using the hardware-software complex are presented below.…”

Automated radiation test setup for functional and parametrical control of 8-bit microcontrollers

“…The designed automated setup was successfully applied in total ionizing dose (TID) radiation hardness tests of MCUs at National Research Nuclear University MEPhI (Moscow, Russia) [10,11]. The developed solutions provide correct MCU parameters measurement and control, data acquisition, processing, displaying and logging.…”

DC–DC's total ionizing dose hardness decrease in passive reserve mode

“…All radiation experiments were supported by soft-hardware automated test setup (ATS) that had been developed for DC-DC's functional and parametrical control [17][18][19][20][21].…”