Hardware-Software Complex for Functional and Parametric Tests of ARM Microcontrollers STM32F1XX

Abstract

Abstract. The article presents the hardware-software complex for functional and parametric tests of ARM microcontrollers STM32F1XX. The complex is based on PXI devices by National Instruments and LabVIEW software environment. Data exchange procedure between a microcontroller under test and the complex hardware is describes. Some test results are also presented.