Automated radiation test setup for functional and parametrical control of 8-bit microcontrollers

Abstract

The developed automated setup for functional and parametric control of 8-bit microcontrollers during radiation hardness tests is presented. The setup hardware is based on the NI modular instruments PXI-7841R and PXI-4110 operated under LabVIEW software. Test circuit and methods together with the user software structure and typical test results are presented.

Automated Data Processing System for Oscilloscope Measurements during an Environmental Test

“…The Figure 2 shows the front panel of the program. The program allows the waveform to be saved as a png file (Figure 3), and, as seen on Figure 2, can be easily integrated as a functional unit of the test system [6][7][8][9][10][11][12], and allows us to work with the oscilloscope remotely, if necessary [13].…”

Hardware-Software Complex for Functional and Parametric Tests of ARM Microcontrollers STM32F1XX

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