1994
DOI: 10.1063/1.111779
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Low energy kinetic threshold in the growth of cubic boron nitride films

Abstract: We report the growth of cubic boron nitride (cBN) films by magnetron sputtering on Si (100) substrates. The films are grown in the presence of negative substrate bias voltages and a nitrogen plasma produced by an electron cyclotron resonance source. We find evidence for a sharp low-voltage threshold in the substrate bias (-105 V) beyond which the samples are predominantly cBN. The structural quality of the cBN films is optimized in a narrow range of voltages near this threshold. We discuss the important role o… Show more

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Cited by 60 publications
(23 citation statements)
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“…The FFT for region 2 show a diffraction pattern of both amorphous and crystalline phases. The crystalline phase represents the image formed by c-BN with (111) reflection [12]. This work is still continuing.…”
Section: Preliminary Tem Resultsmentioning
confidence: 99%
“…The FFT for region 2 show a diffraction pattern of both amorphous and crystalline phases. The crystalline phase represents the image formed by c-BN with (111) reflection [12]. This work is still continuing.…”
Section: Preliminary Tem Resultsmentioning
confidence: 99%
“…If ion-induced atomic displacements are important to cBN formation (see Section 7)> then, as suggested by Kidner et al [78], cBN synthesis should not be possible at energies near or below the displacement energy of atoms in BN (several tens of electronvolts). Several groups have deposited predominantly cBN films at ion energies near or below 100 eV [59,7&l 17,119,121].…”
Section: P B Mirkarimi T't Nl /Mlueri~~ls Science Rrnd Etlgineeriumentioning
confidence: 97%
“…However, there is not yet convincing evidence for cBN synthesis below E = 50 eV. From a study of the ion-energy dependence, Kidner et al [78] proposed an ion-energy threshold of N 100 eV for cBN synthesis. However, more recently the same group [66,121] synthesized cBN at even lower ion energies by using higher ion-to-atom (Jl n) values.…”
Section: P B Mirkarimi T't Nl /Mlueri~~ls Science Rrnd Etlgineeriumentioning
confidence: 99%
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