2010
DOI: 10.1109/ted.2010.2040664
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Local $V_{\rm th}$ Variability and Scalability in Silicon-on-Thin-BOX (SOTB) CMOS With Small Random-Dopant Fluctuation

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Cited by 107 publications
(29 citation statements)
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“…In this work, the power reconfigurable FPGA is designed on the 65-nm SOTB CMOS technology [16] which is the advanced SOI technology with ultra-thin buried-oxide (BOX). The effective energy reduction in the SOTB CMOS technology is recently reported for such new applications as en- ergy harvesting sensor network systems, and long lasting wearable computers [17].…”
Section: Adoption Of Customization Design Rulementioning
confidence: 99%
“…In this work, the power reconfigurable FPGA is designed on the 65-nm SOTB CMOS technology [16] which is the advanced SOI technology with ultra-thin buried-oxide (BOX). The effective energy reduction in the SOTB CMOS technology is recently reported for such new applications as en- ergy harvesting sensor network systems, and long lasting wearable computers [17].…”
Section: Adoption Of Customization Design Rulementioning
confidence: 99%
“…Therefore, RDF-induced V TH fl uctuations are well suppressed. 16 However, the potential fl uctuations due to donors in the source and drain extensions (S/D-RDF) lead to large fl uctuations in the source/drain access resistance and translate to an increase in the on-current variability, as has been recently shown theoretically and experimentally. 17,18 Additionally, the S/D-RDF implies a local modulation of the channel length, and therefore one may expect RDF to impact DIBL fl uctuations too.…”
Section: Qualitative Insight From Modelling and Simulationmentioning
confidence: 93%
“…As a result, by applying this to the SRAM cells, the static noise margins (SNMs) are improved by adding back feedback from the back gate to the front gate [10]. Moreover, SOTB has the smallest threshold voltage variability among bulk MOS, due to its low-dose channel [12]. Figure 1b shows the SPICE simulation results of on-currents and off-currents to the back-bias voltage for the range from 0 V to −1.0 V in a bulk NMOS transistor and an SOTB NMOS transistor in 65-nm technology.…”
Section: Silicon On Thin Buried Oxide (Sotb) Transistormentioning
confidence: 99%