Lattice constant determination from Kossel patterns observed by CCD camera

Langer, Enrico; Däbritz, S.; Schurig, Christian; Hauffe, W.

doi:10.1016/s0169-4332(01)00261-6

Cited by 19 publications

(13 citation statements)

References 8 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…A procedure which is described in Ref. [15] can be used to correct the measured points. In order to be absolutely safe for all measured pixel distances on the CCD pattern exactly identical distances of a 100 mm precision glass measuring rule with 0.1 mm separation were observed with the same geometry in the same way.…”

mentioning

confidence: 99%

Investigation of HOLZ rings in EBSD patterns

Langer

Däbritz

2007

Phys. Status Solidi (c)

View full text Add to dashboard Cite

PACS 61.14. Lj, 61.66.Bi Higher-Order Laue Zone (HOLZ) rings and their appearance in Electron Backscattered Diffraction (EBSD) pattern from molybdenum were fundamentally investigated in the Scanning Electron Microscope. HOLZ rings of the type 100 , 110 , 111 , 113 and 133 could be unambiguous detected in EBSD pattern of different pure Mo crystals. The [100] HOLZ ring was observed more in detail in dependence on the accelerating energy in the pattern center, and the lattice spacing was determined for all energies. A relatively good accuracy could be obtained for Mo as model sample for problematical high atomic number materials.1 Introduction Electron Backscattered Diffraction (EBSD) is a method to determine crystallographic parameter in the micro and nano range of bulk specimens in the Scanning Electron Microscope (SEM). The main applications are the automatic mapping of the crystal orientation of polycrystalline specimens with known crystal structures, an overview is given e.g. in Ref. [1,2], and the study of interfaces, especially grain boundaries [3,4]. It is also possible to distinguish between different previously selected crystallographic phases, see for example [5,6]. A further advantage is the high lateral resolution of up to 6 nm, which, in this case, could be achieved for a thin platinum film deposited on silicon [7].However, the accuracy in the lattice parameter determination obtained by measuring the width of Kikuchi bands is generally very low and at best only about 5% in dependence on the Kikuchi reflections used, sometimes only 10% [8]. Here, an improvement can allow the exploitation of the so-called HigherOrder Laue Zone (HOLZ) rings. The great advantage of the HOLZ rings are the sharp edges and that their diameter is sensitively dependent on the interplanar spacing perpendicular to the zone axis belonging to it. Conventionally, these HOLZ rings were observed in Kossel-Möllenstedt patterns at convergent beam electron diffraction (CBED) [9] in the Transmission Electron Microscopy (TEM). In some cases HOLZ rings can be observed also in EBSD patterns, but they are not as high in contrast as those in the TEM. HOLZ rings in EBSD patterns have not been sufficiently investigated so far. Baba-Kishi suggested to use HOLZ rings for the measurement of lattice constants, and he recorded a First-Order Laue Zone (FOLZ) ring on film from a marcasite crystal (FeS 2 , orthorhombic) [8]. In Ref.[10] it was shown on GaN thin films that HOLZ rings become more clearly visible by cooling the samples. There is only one paper by Michael and Eades [11] which deals with an evaluation of HOLZ rings. In this contribution, reciprocal lattice layer spacings were measured by means of observed HOLZ rings from different crystal systems using a CCD-based camera system. For compounds with a lower average ordinal number in some cases a good agreement between measured and calculated interplanar crystal spacings could be obtained. However, for higher atomic number materials like Mo, Ta and W the difference between measured and calc...

show abstract

mentioning

confidence: 99%

Investigation of HOLZ rings in EBSD patterns

Langer

Däbritz

2007

Phys. Status Solidi (c)

View full text Add to dashboard Cite

show abstract

“…Compared to previous KOSSEL cameras combined with SEM (see [6,18,19]) our device achieves a high magnification and a high resolution of the detected reflections, which is due to a large sample detector distance (≈ 330 mm) and a wide aperture angle of the detectable area of the half-space above the sample. Thus, the advantages of the KOSSEL technique are used very well, particularly with respect to the high precision.…”

Section: Concept and Measurement Techniquesmentioning

confidence: 96%

“…The KOSSEL technique is a special X-ray microdiffraction method where local X-rays are produced by directing a finely focused electron beam or collimated synchrotron radiation (∅ <10 µm and <100 µm, respectively) onto a single crystal sample. Most of the characteristic and continuous X-rays leave the crystal undiffracted and give rise to the undesired background blackening of the detector (film, image plate [4] or CCD camera [5,6]). Only a small amount of the characteristic X-rays reinforce each other and cause the diffraction, satisfying the Bragg law.…”

Section: Concept and Measurement Techniquesmentioning

confidence: 99%

Precise determination of residual stresses in FeSi3 electrical sheets in the vicinity of laser scratches with high lateral resolution

Böhling

Bauch

2007

Cryst. Res. Technol.

View full text Add to dashboard Cite

States of residual stress in laser scribed FeSi3 electrical sheets in the vicinity of the laser scratch have been investigated. The influence of the laser treatment on the distortion of the crystal lattice was not only determined qualitatively but also quantitatively. Residual stresses of third kind were determined. Residual stress maps of the vicinity of the laser scratch were recorded showing clearly the influence of the laser treatment on the stress state as well as on the formation of the domain structure in FeSi3. The dislocation densities and stress states could be determined on spots of micrometer size. This was made possible by coupling the KOSSEL and electron backscatter diffraction (EBSD) techniques in one device at high lateral resolution.Dedicated to Prof. Dr.-Ing. habil. Hartmut Worch on the occasion of his 65th birthday.

show abstract

“…For the local analysis of single and polycrystals, usually, microscanning XRD (μSXRD) is used at synchrotron beamlines. The Kossel diffraction (electron‐beam excitation) and Pseudo‐Kossel diffraction (synchrotron excitation) allow strain determination in the order of 10 −6 . The XRD methods collect information distributed over an interaction volume of some 10 μm 3 and have usually high accuracy for out‐of‐plane components and lower accuracy for in‐plane components …”

Section: Micro‐ and Nanomechanical Stress And Strain Measurementsmentioning

confidence: 99%

Advanced Characterization Methods for Electrical and Sensoric Components and Devices at the Micro and Nano Scales

Sheremet

Meszmer

Blaudeck

et al. 2019

Physica Status Solidi (a)

View full text Add to dashboard Cite

The present study covers the nanoanalysis methods for four key material characteristics: electrical and electronic properties, optical, stress and strain, and chemical composition. With the downsizing of the geometrical dimensions of the electronic, optoelectronic, and electromechanical devices from the micro to the nanoscale and the simultaneous increase in the functionality density, the previous generation of microanalysis methods is no longer sufficient. Therefore, the metrology of materials' properties with nanoscale resolution is a prerequisite in materials' research and development. The article reviews the standard analysis methods and focuses on the advanced methods with a nanoscale spatial resolution based on atomic force microscopy (AFM): current-sensing AFM (CS-AFM), Kelvin probe force microscopy (KPFM), and hybrid optical techniques coupled with AFM including tip-enhanced Raman spectroscopy (TERS), photothermal-induced resonance (PTIR) characterization methods (nano-Vis, nano-IR), and photo-induced force microscopy (PIFM). The simultaneous acquisition of multiple parameters (topography, charge and conductivity, stress and strain, and chemical composition) at the nanoscale is a key for exploring new research on structure-property relationships of nanostructured materials, such as carbon nanotubes (CNTs) and nano/microelectromechanical systems (N/MEMS). Advanced nanocharacterization techniques foster the design and development of new functional materials for flexible hybrid and smart applications.

show abstract

Lattice constant determination from Kossel patterns observed by CCD camera

Cited by 19 publications

References 8 publications

Investigation of HOLZ rings in EBSD patterns

Investigation of HOLZ rings in EBSD patterns

Precise determination of residual stresses in FeSi3 electrical sheets in the vicinity of laser scratches with high lateral resolution

Advanced Characterization Methods for Electrical and Sensoric Components and Devices at the Micro and Nano Scales

Contact Info

Product

Resources

About