There are world-wide efforts to analyse micron regions of compact samples by means of X-ray diffraction ("X-ray Microdiffraction"). Two micro diffraction procedures, the KOSSEL technique excited by electron or synchrotron radiation beams and the new X-ray Rotation-Tilt Method (XRT), are compared to show their possibilities and limitations. Some selected examples of new applications are presented.

A new application of the KOSSEL and the XRT (X-ray Rotation-Tilt) technique arises from local residual stress measurements in micro regions. Already in 1996/97, we started to conduct such investigations based on the KOSSEL method. Because of the high lateral resolution residual stresses of the third kind can be determined. Some further evaluation procedures are described.

Samples of laser-scratched FeSi3 transformer sheets have been investigated. The investigations were carried out by using the Kossel and EBSD techniques in our self-designed multifunctional system. The results show residual stress mappings of the cut edges of FeSi3 transformer sheets and their dependence on the cutting process (conventional plate shears, abrasive water-jet technique, laser cutting).

States of residual stress in laser scribed FeSi3 electrical sheets in the vicinity of the laser scratch have been investigated. The influence of the laser treatment on the distortion of the crystal lattice was not only determined qualitatively but also quantitatively. Residual stresses of third kind were determined. Residual stress maps of the vicinity of the laser scratch were recorded showing clearly the influence of the laser treatment on the stress state as well as on the formation of the domain structure in FeSi3. The dislocation densities and stress states could be determined on spots of micrometer size. This was made possible by coupling the KOSSEL and electron backscatter diffraction (EBSD) techniques in one device at high lateral resolution.Dedicated to Prof. Dr.-Ing. habil. Hartmut Worch on the occasion of his 65th birthday.

KurzfassungEs gibt weltweite Anstrengungen, Mikrobereiche kompakter Proben mittels Röntgenmikrobeugungsverfahren („X-ray Microdiffraction“) zu untersuchen. Die synchrotron- bzw. elektronenstrahlangeregte KOSSEL-Technik (Teil 1) und die neu entwickelte Röntgen-Drehschwenk-Technik (Teil 2) werden als spezielle röntgenographische Verfahren vorgestellt und hinsichtlich ihrer Einsatzmöglichkeiten und Grenzen verglichen. Ausgehend vom Funktionsprinzip der neuen Röntgen-Drehschwenk-Technik werden ausgewählte Anwendungen im Mikrobereich beschrieben. Eine vergleichende Betrachtung zur KOSSEL-Technik ergänzt die Darstellung.