Precise determination of residual stresses in FeSi3 electrical sheets in the vicinity of laser scratches with high lateral resolution

Böhling, M.; Bauch, Jürgen

doi:10.1002/crat.200710938

Cited by 7 publications

(4 citation statements)

References 17 publications

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“…Many fields of diagnostic analysis use x-ray based methods, including material defect detection and structural analysis [1][2][3]. For such purposes the strength of the dose delivered to the sample can lie within a broad range without greatly affecting the end result.…”

Section: Introductionmentioning

confidence: 99%

A carbon nanotube based x-ray detector

et al. 2016

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X-ray detectors based on metal-oxide semiconductor field effect transistors couple instantaneous measurement with high accuracy. However, they only have a limited measurement lifetime because they undergo permanent degradation due to x-ray beam exposure. A field effect transistor based on carbon nanotubes (CNTs), however, overcomes this drawback of permanent degradation, because it can be reset into its starting state after being exposed to the x-ray beam. In this work the CNTs were deposited using a dielectrophoresis method on SiO coated p-type (boron-doped) Si substrates. For the prepared devices a best gate voltage shift of 244 V Gy and a source-drain current sensitivity of 382 nA Gy were achieved. These values are larger than those reached by the currently used MOSFET based devices.

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Section: Introductionmentioning

confidence: 99%

A carbon nanotube based x-ray detector

et al. 2016

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“…Then, it was adapted to scanning electron microscopy (SEM) (Dingley, 1975); this enables the recording of diffraction patterns while the microstructure of the specimen is observed. Nowadays, with the application of digital cameras for pattern acquisition (Pesci et al, 2006;Bö hling & Bauch, 2007), the analysis of SEM-based Kossel patterns can be automated to a considerable extent. For a review of Kossel diffraction and its applications, see Lider (2011).…”

Section: Introductionmentioning

confidence: 99%

“…There are various claims on the spatial resolution of the SEM-based Kossel technique (Dingley, 1975;Bö hling & Bauch, 2007). It is believed to be in the broad range from 1 to 10 mm.…”

Section: Introductionmentioning

confidence: 99%

“…Strain determination is linked to lattice parameter determination. Taking this into account, various sources on the accuracy of the Kossel technique can be quoted (Tixier & Waché, 1970;Dingley, 1975;Lamaze & Despujols, 1976;Cunningham & Ashbee, 1990;Bö hling & Bauch, 2007;Langer & Daebritz, 2010;Lider, 2011), and the estimates of strain resolution vary from 5 Â 10 À4 to 1 Â 10 À6 . However, most of the strain or lattice parameter determination methods require special crystal orientations or particular configurations of Kossel lines.…”

Section: Introductionmentioning

confidence: 99%

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Strain resolution of scanning electron microscopy based Kossel microdiffraction

et al. 2014

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Science Arts & Métiers (SAM)is an open access repository that collects the work of Arts et Métiers ParisTech researchers and makes it freely available over the web where possible. Kossel microdiffraction in a scanning electron microscope enables determination of local elastic strains. With Kossel patterns recorded by a CCD camera and some automation of the strain determination process, this technique may become a convenient tool for analysis of strains. As for all strain determination methods, critical for the applicability of the Kossel technique is its strain resolution. The resolution was estimated in a number of ways: from the simplest tests based on simulated patterns (of an Ni alloy), through analysis of sharp experimental patterns of Ge, to estimates obtained by in situ tensile straining of single crystals of the Ni-based superalloy. In the latter case, the results were compared with those of conventional X-ray diffraction and synchrotron-based Kossel diffraction. In the case of high-quality Ge patterns, a resolution of 1 Â 10 À4 was reached for all strain tensor components; this corresponds to a stress of about 10 MPa. With relatively diffuse patterns from the strained Ni-based superalloy, under the assumption of plane stress, the strain and stress resolutions were 3 Â 10 À4 and 60 MPa, respectively. Experimental and computational conditions for achieving these resolutions are described. The study shows potential perspectives and limits of the applicability of semiautomatic Kossel microdiffraction as a method of local strain determination.

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75 years of Kossel patterns – past and future

Langer¹,

Däbritz²

2010

IOP Conf. Ser.: Mater. Sci. Eng.

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Precise determination of residual stresses in FeSi3 electrical sheets in the vicinity of laser scratches with high lateral resolution

Cited by 7 publications

References 17 publications

A carbon nanotube based x-ray detector

A carbon nanotube based x-ray detector

Strain resolution of scanning electron microscopy based Kossel microdiffraction

75 years of Kossel patterns – past and future

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