2005
DOI: 10.1109/ted.2005.850676
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Lateral High-Speed Bipolar Transistors on SOI for RF SoC Applications

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Cited by 33 publications
(13 citation statements)
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“…However, CMOS fabrication favors lateral bipolar transistor concepts [1][2][3][4][5][6] on SOI since it is easier to tune the SOI layer properties to optimize the CMOS devices without degrading the performance of the bipolar devices [2]. Realization of a true low cost complementary-BiCMOS process is possible only when the lateral bipolar transistors can be fabricated on CMOS using simple fabrication steps with low thermal budgets.…”
Section: Introductionmentioning
confidence: 99%
“…However, CMOS fabrication favors lateral bipolar transistor concepts [1][2][3][4][5][6] on SOI since it is easier to tune the SOI layer properties to optimize the CMOS devices without degrading the performance of the bipolar devices [2]. Realization of a true low cost complementary-BiCMOS process is possible only when the lateral bipolar transistors can be fabricated on CMOS using simple fabrication steps with low thermal budgets.…”
Section: Introductionmentioning
confidence: 99%
“…However, for radio frequency (RF) applications, BJT is still superior to MOSFET for its well-behaved characteristics. Thus, many BJT based novel devices such as SiGe HBT, SiGe BiCMOS [1][2][3], and SOI lateral BJT [8][9][10] have been developed. Nevertheless, these devices suffer also the drawback of complicated fabrication processes, and thus resulting in a high preparing cost.…”
Section: Introductionmentioning
confidence: 99%
“…The figure shows that the resistive path from the base metal contact to the intrinsic base resistance, RB(int), is comprised of the base-poly resistance RB(POlY), resistance due to the PSWS RB(PSWS), and resistance of the p+ region, RB(P+): RB = RB(int) + RB(P+) + RB(PSWS) + RB(POlY) (1) The resistance of the base-poly and the PSWS and the p+ region can be calculated from the device geometry RB(POlY) = RS(pol hpoLy (2) RB(PSWS) hRS(PS s) LE (3) RB(P+) RS(P+) LE (4) where RS(poIy), Rs(psws), and Rs(p+) are the sheet resistances of the base-poly, PSWS, and p+ region respectively. As none of these extrinsic resistances change with bias, they are are represented by Rbb extemal to the SGP model: Rbb = RB(p+) + RB(PSWS) + RB(POIY) (5) In Figure 1, there are several capacitances unique to the LBJT that must be modelled.…”
Section: Device Modelmentioning
confidence: 99%
“…This has already been implemented in a commercial CMOS technology [3] for microprocessors. The successful implementation of the lateral BJT on SOI [4] is a critical step towards the realization of a true complementary-BiCMOS processenabling low cost, high speed, RF and mixed-signal SoC designs. Successful modelling of the lateral bipolar device is also required in order to achieve operational circuit designs.…”
Section: Introductionmentioning
confidence: 99%
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