1978
DOI: 10.1007/978-3-663-05668-3
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Ionenimplantation

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Cited by 135 publications
(33 citation statements)
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“…Since the annealing treatment of the implanted targets was performed under oxygen atmosphere, a layer of SiO 2 oxide has been formed on the samples surface. Hence, during the annealing, we suppose that antimony ions are forced to migrate to Si/SiO 2 interface because of the low diffusivity of Sb in Si [2,3] and the lower diffusivity of Sb in SiO 2 [9]. Consequently, after the etching (with HF) of the annealed samples, the SiO 2 layer is removed and an important quantity of antimony is lost.…”
Section: Resultsmentioning
confidence: 99%
“…Since the annealing treatment of the implanted targets was performed under oxygen atmosphere, a layer of SiO 2 oxide has been formed on the samples surface. Hence, during the annealing, we suppose that antimony ions are forced to migrate to Si/SiO 2 interface because of the low diffusivity of Sb in Si [2,3] and the lower diffusivity of Sb in SiO 2 [9]. Consequently, after the etching (with HF) of the annealed samples, the SiO 2 layer is removed and an important quantity of antimony is lost.…”
Section: Resultsmentioning
confidence: 99%
“…In addition the depth profile deviates substantially from a Gaussian-like profile. This might be caused by effects like sputtering, range shortening and recoil implantation [24,25]. Annealing of the sample leads to no significant diffusion of Ti + or O + , but to an increase of the passivation layer of stainless steel in form of iron oxides.…”
Section: Afm and Simsmentioning
confidence: 99%
“…5 the scheme of the radiation defect formation is shown. According to the theoretical calculation [16] the distribution of the implanted ion density with depth x follows the Gaussian law and may be written as…”
Section: Model Of the Evolution Of Radiation Defectsmentioning
confidence: 99%