2010
DOI: 10.3390/ma3104811
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Ion-Induced Nanoscale Ripple Patterns on Si Surfaces: Theory and Experiment

Abstract: Nanopatterning of solid surfaces by low-energy ion bombardment has received considerable interest in recent years. This interest was partially motivated by promising applications of nanopatterned substrates in the production of functional surfaces. Especially nanoscale ripple patterns on Si surfaces have attracted attention both from a fundamental and an application related point of view. This paper summarizes the theoretical basics of ion-induced pattern formation and compares the predictions of various conti… Show more

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Cited by 105 publications
(57 citation statements)
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“…We calculated a value for the exponent m of 0.65 ± 0.15 for TiO 2 , which is above the value of m = 0.3 expected from the theory for ion-induced surface self-diffusion. However, the discrepancy can be explained by considering redeposition processes during the sputter process, which lead to a coarsening of the ripple wavelength over irradiation time [24,25]. For our Si reference sample set we obtained an exponent m of 0.5 ± 0.05 (see supplementary information), which is well in agreement with experimental data already published [26], obtained from irradiation with argon ions.…”
Section: Structural Characterizationsupporting
confidence: 81%
“…We calculated a value for the exponent m of 0.65 ± 0.15 for TiO 2 , which is above the value of m = 0.3 expected from the theory for ion-induced surface self-diffusion. However, the discrepancy can be explained by considering redeposition processes during the sputter process, which lead to a coarsening of the ripple wavelength over irradiation time [24,25]. For our Si reference sample set we obtained an exponent m of 0.5 ± 0.05 (see supplementary information), which is well in agreement with experimental data already published [26], obtained from irradiation with argon ions.…”
Section: Structural Characterizationsupporting
confidence: 81%
“…[5][6][7][8][9][10][11][12][13][14] In particular, metallic surfactants like Fe and Mo induce pronounced dot and ripple patterns on Si substrates even during normal and near normal ion incidence sputter erosion. 2,8,9,[11][12][13] In the absence of co-deposition of foreign atoms and for normal and near normal ion incidence, even for incidence angles up to 50…”
Section: Introductionmentioning
confidence: 99%
“…Both effects are known to contribute to roughening and to the formation of spatially periodic ripple patterns. Pattern formation due to curvaturedependent ion beam erosion can be described by the linear theory of Bradley-Harper (BH) [1] and related theories with non-linear extensions [2][3][4][5][6][7][8]. In the BH model, curvature-dependent sputtering depends linearly on the locally deposited energy approximated by Sigmund's ellipsoidal energy deposition [9].…”
Section: Introductionmentioning
confidence: 99%