“…Since the continuous thin layer of silver remains in the three-layer stack after the diffusion occurred under the annealing conditions investigated in this study, the diffusion equation (Fick's second law) was solved for an infinite couple with constant surface composition [4]. The solution for the concentration profile in this case is based on the error function [6,24]. Diffusivity values that combine the diffusion coefficients in both directions (towards the airside and glass substrate) are presented in Table 1.…”
Section: Diffusion Behaviour In Titania/ag/titania Stacksmentioning
confidence: 99%
“…Tel: +441612476432 silver. This included time-of-flight secondary-ion mass spectrometry (TOF-SIMS) analysis (ION TOF 5) with a Bi3 + analysis beam and a 1 keV Cs + sputter beam, using a methodology explained elsewhere [6]. Due to the limited quantification of the TOF-SIMS results, selected samples were also analysed by X-ray photoelectron spectroscopy (XPS, VG-ESCALAB 220iXL spectrometer) and Rutherford backscattering spectrometry (RBS).…”
Low emissivity (low-E) coatings consisting of dielectric/silver/dielectric multi-layer stacks are applied to large-area architectural glazing to reduce heat losses from buildings. In this work TiO2/Ag/TiO2 stacks were deposited onto soda-lime glass by pulsed DC reactive magnetron sputtering. The coatings were annealed in the range 100−600 o C to study silver diffusion through neighbouring layers. Depth-profiling analysis was performed on these samples using time-of-flight secondary ion mass spectrometry and selected samples were also analysed by X-ray photoelectron spectroscopy and Rutherford backscattering spectrometry. Fick's second diffusion law
“…Since the continuous thin layer of silver remains in the three-layer stack after the diffusion occurred under the annealing conditions investigated in this study, the diffusion equation (Fick's second law) was solved for an infinite couple with constant surface composition [4]. The solution for the concentration profile in this case is based on the error function [6,24]. Diffusivity values that combine the diffusion coefficients in both directions (towards the airside and glass substrate) are presented in Table 1.…”
Section: Diffusion Behaviour In Titania/ag/titania Stacksmentioning
confidence: 99%
“…Tel: +441612476432 silver. This included time-of-flight secondary-ion mass spectrometry (TOF-SIMS) analysis (ION TOF 5) with a Bi3 + analysis beam and a 1 keV Cs + sputter beam, using a methodology explained elsewhere [6]. Due to the limited quantification of the TOF-SIMS results, selected samples were also analysed by X-ray photoelectron spectroscopy (XPS, VG-ESCALAB 220iXL spectrometer) and Rutherford backscattering spectrometry (RBS).…”
Low emissivity (low-E) coatings consisting of dielectric/silver/dielectric multi-layer stacks are applied to large-area architectural glazing to reduce heat losses from buildings. In this work TiO2/Ag/TiO2 stacks were deposited onto soda-lime glass by pulsed DC reactive magnetron sputtering. The coatings were annealed in the range 100−600 o C to study silver diffusion through neighbouring layers. Depth-profiling analysis was performed on these samples using time-of-flight secondary ion mass spectrometry and selected samples were also analysed by X-ray photoelectron spectroscopy and Rutherford backscattering spectrometry. Fick's second diffusion law
“…1 To achieve this functionality, these glasses incorporate a stacked structure consisting typically of a thin metal sandwiched between two oxides thin films. 2,3 This type of structures has been modeled and fabricated for several decades and nowadays represent a commercial product manufactured and sold by different companies all over the world. 4 Low-e glasses must depict two main features: a high optical transparency in the visible region and a high reflectance in the near-infrared region.…”
In the present work we have investigated the relationships existing between the optical properties and the growth mechanism, microstructure and surface roughness of SnO 2 and ZnO oxide films prepared by magnetron sputtering under conditions resembling those utilized in industry. Thin films of these oxides with different thicknesses were characterized by atomic force microscopy, glancing incidence X-ray diffraction (GIXRD), X-ray reflectometry and spectroscopic Ellipsometry. The roughness evolution of the film properties (density, surface roughness and refraction index) as a function of their thickness has been evaluated within the concepts of the Dynamic Scaling Theory of thin film growth. Zinc oxide films were rougher than tin oxide films of similar *Manuscript Click here to view linked References 2 thickness, indicating a different growing mechanism for the two materials. Silver was evaporated onto the surface of the two oxide thin films and its earlier stages of nucleation studied by background analysis of the X-ray photoemission spectra. A different nucleation mechanism was found depending on the nature of the oxide acting as substrate. The superior performance of the zinc oxide based low emissive coatings is related with a better wetting of silver on the surface of this oxide despite the comparatively lower roughness of the tin oxide layers.
“…and post-treatment process (including annealing temperature, time and ambient, etc.). Quantitative micro-compositional analyses of both the undoped and doped ZnO materials and their stoichiometric deviation have been reported in the literatures [8][9][10].…”
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.