2012
DOI: 10.1016/j.matlet.2012.06.107
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Study of oxygen vacancies′ influence on the lattice parameter in ZnO thin film

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Cited by 213 publications
(68 citation statements)
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“…The first one we assign to the presence of As Zn -2V Zn complexes and the second one to As Zn . In this work we demonstrate that the As 3d XPS spectra changes as a result of annealing in various atmospheres and as a result of additional acceptor doping ( [26][27][28] In all "as-grown" samples the amount of As atoms located at oxygen sites (As3d A ) was small (5-10%) and, moreover, this contribution appeared to be relatively lower in single As-doped layer (Fig. 4).…”
Section: Resultsmentioning
confidence: 60%
“…The first one we assign to the presence of As Zn -2V Zn complexes and the second one to As Zn . In this work we demonstrate that the As 3d XPS spectra changes as a result of annealing in various atmospheres and as a result of additional acceptor doping ( [26][27][28] In all "as-grown" samples the amount of As atoms located at oxygen sites (As3d A ) was small (5-10%) and, moreover, this contribution appeared to be relatively lower in single As-doped layer (Fig. 4).…”
Section: Resultsmentioning
confidence: 60%
“…It is noticed that the X-ray peaks of w-ZnO trend to shift to lower diffraction angles while prolonging the exposure time, indicating an increase of the average size of the unit cell. This effect is attributed to gradual incorporation of oxygen atoms in the crystal structure of ZnO [19]. In each pattern, the strongest X-ray reflection is indicated in bold.…”
Section: Resultsmentioning
confidence: 99%
“…Fig. 6(c) exhibits two deconvoluted sub-peaks of O1s at 530.5 ± 0.2 eV (O W ) and 532.5 ± 0.2 eV (O H) assigned to the lattice O 2− ions and to oxygendeficient related defects (or OH groups), respectively [5,[35][36][37]. Mg2p peaks were detected by XPS measurement, as shown in Fig.…”
Section: X-ray Photoelectron Spectroscopy (Xps) Analysis Of Hmgzo Thimentioning
confidence: 99%