1992
DOI: 10.1016/0038-1101(92)90235-5
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Infrared transmission topography for whole-wafer gallium arsenide materials characterization

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Cited by 8 publications
(1 citation statement)
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“…GaAs material vendors generally report measured shallow acceptor concentrations between lo"/cm' and 10'5/cm3 and deep donor EL2 concentrations on the order of 10 16 /cm3. Independent measurements utilizing an optical transmission technique [42,43] indicated that the material used for our detectors had acceptor concentrations on the order 10 15 /cm3 and deep donor EL2 concentrations on the order of 10 16 /cm3 [44] . At room temperature, the shallow dopants are assumed to be fully ionized such that Na-= Na and Nd = Nd .…”
Section: Detectors Fabricated From Bulk Gaasmentioning
confidence: 99%
“…GaAs material vendors generally report measured shallow acceptor concentrations between lo"/cm' and 10'5/cm3 and deep donor EL2 concentrations on the order of 10 16 /cm3. Independent measurements utilizing an optical transmission technique [42,43] indicated that the material used for our detectors had acceptor concentrations on the order 10 15 /cm3 and deep donor EL2 concentrations on the order of 10 16 /cm3 [44] . At room temperature, the shallow dopants are assumed to be fully ionized such that Na-= Na and Nd = Nd .…”
Section: Detectors Fabricated From Bulk Gaasmentioning
confidence: 99%