2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo) 2019
DOI: 10.1109/emccompo.2019.8919926
|View full text |Cite
|
Sign up to set email alerts
|

In-Place Power Noise and Signal Waveform Measurements on LVDS Channels in Fan-Out Multiple IC Chip Packaging

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2021
2021
2022
2022

Publication Types

Select...
2

Relationship

1
1

Authors

Journals

citations
Cited by 2 publications
(1 citation statement)
references
References 8 publications
0
1
0
Order By: Relevance
“…Those are attributed naturally to the construction of 3DIC stacks with vertically distributed capacitors among power delivery networks (PDNs) [25], [26]. The benefits of embedded capacitors in FOWLP devices were also exhibited by monitoring power and signal waveforms [27], [28]. The implications with the different property of interposers have been relevantly discussed with the same device architecture but integrated on a Si passive interposer differently from the fan-out one, which should be referred to [29].…”
Section: Introductionmentioning
confidence: 99%
“…Those are attributed naturally to the construction of 3DIC stacks with vertically distributed capacitors among power delivery networks (PDNs) [25], [26]. The benefits of embedded capacitors in FOWLP devices were also exhibited by monitoring power and signal waveforms [27], [28]. The implications with the different property of interposers have been relevantly discussed with the same device architecture but integrated on a Si passive interposer differently from the fan-out one, which should be referred to [29].…”
Section: Introductionmentioning
confidence: 99%