“…However, such a procedure is relatively complex that inevitably results in a low production yield. Recently, it has been reported that one can reduce the defect density in nitride-based epitaxial layers using GaN-SiN as the nucleation layer [8][9][10][11][12][13][14][15]. Many nanometer-sized porous SiN layer probably serves to enhance the lateral growth, which is quite similar to that in ELO to reduce dislocation density.…”