2001
DOI: 10.1063/1.1409277
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Improvement of the optical properties of metalorganic chemical vapor deposition grown GaN on sapphire by an in situ SiN treatment

Abstract: DOI to the publisher's website. • The final author version and the galley proof are versions of the publication after peer review. • The final published version features the final layout of the paper including the volume, issue and page numbers. Link to publication General rights Copyright and moral rights for the publications made accessible in the public portal are retained by the authors and/or other copyright owners and it is a condition of accessing publications that users recognise and abide by the legal… Show more

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Cited by 26 publications
(19 citation statements)
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“…It was found that the TD density can be lowered one order of magnitude than the conventional UVLED by inserting the SiN buffer layer. The density of dislocations is remarkably lower in GaN layers grown after SiN buffer than the density in layers obtained using the conventional process [13][14][15]. Fig.…”
Section: Methodsmentioning
confidence: 79%
See 1 more Smart Citation
“…It was found that the TD density can be lowered one order of magnitude than the conventional UVLED by inserting the SiN buffer layer. The density of dislocations is remarkably lower in GaN layers grown after SiN buffer than the density in layers obtained using the conventional process [13][14][15]. Fig.…”
Section: Methodsmentioning
confidence: 79%
“…However, such a procedure is relatively complex that inevitably results in a low production yield. Recently, it has been reported that one can reduce the defect density in nitride-based epitaxial layers using GaN-SiN as the nucleation layer [8][9][10][11][12][13][14][15]. Many nanometer-sized porous SiN layer probably serves to enhance the lateral growth, which is quite similar to that in ELO to reduce dislocation density.…”
Section: Introductionmentioning
confidence: 99%
“…The broadening of this peak suggests that GaN epilayer is non-uniform within the PL laser spot. Considering that the carrier concentration, as measured by CV, was 1.1E17 cm À3 and 1.3E17 cm À3 for sample #1 and #6 respectively, the difference in intensity between both samples can be the result of a different defect densities [26].…”
Section: Article In Pressmentioning
confidence: 99%
“…The in situ treatment of SiN x is reported to be effective in reducing the dislocation density by promoting selective nucleation and a 3D growth mode in the initial stages of the growth [8][9][10]. In this method the sapphire is exposed to a simultaneous flow of SiH 4 and NH 3 , which results in the formation of a thin amorphous SiN x layer.…”
Section: Introductionmentioning
confidence: 99%
“…The GaN-NL grown on the SiN x -treated sapphire is reported to consist of a reduced number of a well-defined 3D large-sized islands instead of a flat layer-like GaN-NL with a large number of tiny crystallites, which cover the whole substrate (in case of no pre-treatment) [1,8]. The achievement of selective growth just by in situ treatment makes this method attractive in terms of its simplicity and low costs.…”
Section: Introductionmentioning
confidence: 99%