2013 15th European Conference on Power Electronics and Applications (EPE) 2013
DOI: 10.1109/epe.2013.6631841
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Improvement of IGBT model characterization with experimental tests

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Cited by 12 publications
(4 citation statements)
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“…On the other hand, the inclusion of a 10% freewheeling time mitigates the turn-on surge, and the IGBT switching power loss reduces almost by one order of magnitude. These switching transients demonstrate a good agreement with results from ANSYS/Simplorer R , whose IGBT/diode model has been experimentally validated against real devices and shows a decent accuracy from both static and dynamic perspectives [29], [30]. The accumulated energy losses under these 2 scenarios also show a good agreement with the validation tool in Fig.…”
Section: Heterogeneous Cpu/gpu Hpc Results and Validationsupporting
confidence: 73%
“…On the other hand, the inclusion of a 10% freewheeling time mitigates the turn-on surge, and the IGBT switching power loss reduces almost by one order of magnitude. These switching transients demonstrate a good agreement with results from ANSYS/Simplorer R , whose IGBT/diode model has been experimentally validated against real devices and shows a decent accuracy from both static and dynamic perspectives [29], [30]. The accumulated energy losses under these 2 scenarios also show a good agreement with the validation tool in Fig.…”
Section: Heterogeneous Cpu/gpu Hpc Results and Validationsupporting
confidence: 73%
“…The IGBT chip model is characterised by a semi‐automatic characterisation tool of the simulation software [29] and it is used to investigate IGBT behaviour in [30]. Information for characterisation is extracted from the device datasheet [31] (typical parameter values are used in this study).…”
Section: Simulation Modelmentioning
confidence: 99%
“…Earlier works on EMI modelling of power converters usually use lumped circuits to model high frequency behavior of the circuits [10]- [12]. This technique is called time-domain modelling and requires detailed information of all the internal and parasitic impedances in the circuits and the physics-based models of the semiconductor devices, which may not be available.…”
Section: Introductionmentioning
confidence: 99%