In the present paper, the linearly graded work function (LG-W) characteristics are explored by using binary metal alloy ab1 - gate electrode composition in a high-k gate stack with a dielectric pocket in vertically aligned TFET (VTFET). The VTFET device is constructed using a binary metal alloy gate electrode with a linearly graded work function and an air pocket. The proposed structure performance metrics are evaluated and compared to the state-of-the-art. The integration of LG-W with gate-stack VTFET along with air pocket, namely SG-LG-VTFET with air pocket, reveals performance improvement via metrics such as device ON-current (ION), subthreshold swing (SS), transconductance (gm) as well as transconductance generation efficiency (TGE). SG-LG-VTFET with air pocket generates SS of 13.92 mV/dec. Further, the device exhibits a higher ION (3.610 -5 A/µm) with an ION/IOFF ratio of 10 12 . Due to the inclusion of the LG-W and air pocket, a narrow band-bending is observed, thus resulting in higher tunneling and steeper SS. A high-k stacked dielectric material enhances the capacitive coupling. The performance of the device is compared with the VTFET device in the absence of a dielectric pocket. The dielectric pocket increases the electric field, which is a desirable phenomenon for increasing the ON-current. For future applications, the scaling in SS is further possible that can increase the electron tunneling rate.