2020
DOI: 10.1007/s00339-020-04065-5
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Implementation of linearly modulated work function AσB1−σ gate electrode and Si0.55Ge0.45 N+ pocket doping for performance improvement in gate stack vertical-TFET

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Cited by 17 publications
(8 citation statements)
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“…It is a gate stacked linearly graded work function VTFET (SG-LGW-VTFET with air pocket) such that it varies unceasingly and linearly with '' (mole division) metric of combined metals (A and B). This can be given as follows [14]:…”
Section: Gate Stacked Linearly Graded Work Function Metal Electrode V...mentioning
confidence: 99%
See 1 more Smart Citation
“…It is a gate stacked linearly graded work function VTFET (SG-LGW-VTFET with air pocket) such that it varies unceasingly and linearly with '' (mole division) metric of combined metals (A and B). This can be given as follows [14]:…”
Section: Gate Stacked Linearly Graded Work Function Metal Electrode V...mentioning
confidence: 99%
“…where φA and φB are the work functions of metals A and B, while ρA and ρB are the densities of state found for metals A and B. With the unity value of the electronic specific heat ratio, the metric φ() of a metal alloy is further evaluated as [14]: In addition, a dielectric pocket is incorporated into the device structure for better tunneling, higher ON current and transconductance. Fig.…”
Section: Gate Stacked Linearly Graded Work Function Metal Electrode V...mentioning
confidence: 99%
“…For simulation, the Silvaco TCAD Atlas tool has been used. The Shockley-Read-Hall model and band-toband tunneling have been used for generation-recombination of electron-hole pairs, and self-consistent coupled Schrödinger Poisson model has been used to derive electron density [12]. The non-equilibrium green function model (NEGF model) solves these coupled equations through a stable and oscillation-less iteration [13].…”
Section: Device Design and Simulation Parametersmentioning
confidence: 99%
“…-e-mail: shailendras.ec.18@nitj.ac.in Design and Investigation of Gate Stacked Vertical TFET with N + SiGe pocket doped heterojunction for performance enhancement will significantly boost the tunneling current density as it is not directly dependent on the device's channel thickness [23][24][25]. To improve the current ratio, it has also been reported that by introducing the delta-doped or pocket layer in the middle of the source channel area of the low bandgap of Si0.2Ge0.8 material will improve the current ratio and the subthreshold slope, which was earlier restricted to the range of 30-50 mV/dec [26,27]. However, individually, these methods effectively work to the system but not efficient when it comes to the high-performance requirement of densely packed circuits.…”
Section: Introductionmentioning
confidence: 99%