Imaging microwave electric fields using a near-field scanning microwave microscope

Dutta, S. K.; Vlahacos, C. P.; Steinhauer, D. E.; Thanawalla, Ashfaq S.; Feenstra, B. J.; Wellstood, F. C.; Anlage, Steven M.; Newman, H. S.

doi:10.1063/1.123137

Cited by 66 publications

(30 citation statements)

References 9 publications

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“…The system is based on a direct measurement method [7,8]. The probe is connected to a spectrum analyzer and is mounted on a five-axis robot.…”

Section: Methodsmentioning

confidence: 99%

“…The second information delivered by these simulations is the non-linear variation between the output voltage and the surface S of the inner conductor. While using the capacitive model which is classically used to describe these probes, it must have a linear variation between the output voltage or current and the surface S : i = jω 0 E z S [8]. Capacitive model does not take into account coupling with external conductor.…”

Section: Influence Of the Diameter Of The Probementioning

confidence: 99%

See 1 more Smart Citation

Characterization of the Open-Ended Coaxial Probe Used for Near-Field Measurements in Emc Applications

Baudry¹,

Louis²,

Mazari³

2006

PIER

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Abstract-A completely automatically near-field mapping system is developed within IRSEEM (Research Institute for Electronic Embedded Systems) in order to determine electromagnetic field radiated by electronic systems. This test bench uses a 3D positioning system of the probe to make accurate measurements. The main element of this measurement tool is the probe. This paper presents a characterization of the open-ended coaxial probe which is used to measure the normal component of the electric field.

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“…The system is based on a direct measurement method [7,8]. The probe is connected to a spectrum analyzer and is mounted on a five-axis robot.…”

Section: Methodsmentioning

confidence: 99%

Section: Influence Of the Diameter Of The Probementioning

confidence: 99%

Characterization of the Open-Ended Coaxial Probe Used for Near-Field Measurements in Emc Applications

Baudry¹,

Louis²,

Mazari³

2006

PIER

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“…The acquisition of the sample topography is necessary to keep the separation between the antenna and sample constant. Due to the sample tilt and step-like features of the sample surface, which may cause the variation of this separation or even exceed the working distance and cause the collision of the antenna with the sample surface, conventional horizontal plane scanning [1], [2], [6] cannot be implemented. We have used an atomic force microscopy (AFM)-like technique utilizing a quartz tuning fork [7], [8] for acquisition of the sample topography, as presented in Fig.…”

Section: Electric-field Antennas and Position/signal Difference Mmentioning

confidence: 99%

“…In some cases, a modification in the probe geometry, such as the use of slit probes [3], [4], small dipole antennas, and open-ended transmission lines [5], [6] can increase signal-matching effi- ciency, change the polarization, or limit the region to which the antenna is sensitive. Due to good sensitivity and well-defined electric properties, we have focused our attention on the miniaturized coaxial antennas-cylindrical short monopoles-where a central conductor protrudes for a defined length from the shielding (see Fig.…”

Section: Electric-field Antennas and Position/signal Difference Mmentioning

confidence: 99%

Measurement of electric-field intensities using scanning near-field microwave microscopy

Kantor

Shvets

2003

IEEE Trans. Microwave Theory Techn.

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Abstract-In this paper, we propose methods for the measurement of electric intensities of a microwave field above the surface of microwave circuits. Using miniaturized coaxial antennas, we measure all spatial components of the induced field above device-under-test. A special position/signal difference method is used to better localize the measured field and increase the spatial resolution of the field mapping. During the scanning process, the antenna is driven at the defined distance above the sample surface according to previously acquired topographic data. For measurement of the tangential-field components parallel to the sample surface, the antenna is tilted by approximately 45 relative to the sample surface. By its rotation about the vertical axis, various components of the field are measured, and vertical and horizontal electric-field intensities are recalculated. The probes are calibrated in a well-defined field standard and allow good quantitative characterization of the measured field.Index Terms-Coaxial antennas, near-field measurements, scanning near-field microscopy.

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“…Nevertheless, the modeling and simulation methods require more reliable practical investigation from efficient experimentations. So, different scanning techniques of EM NF were proposed [27][28][29][30][31][32][33][34][35][36]. But most of the existing measurement techniques are not completely mature for the EM NF radiation characterization of low frequency electrical and power electronic devices.…”

Section: Introductionmentioning

confidence: 99%

Experimental Investigation on the Power Electronic Transistor Parameters Influence to the Near-Field Radiation for the Emc Applications

Manjombe¹,

Azzouz²,

Baudry³

et al. 2011

PIER M

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Abstract-With the increases of the module integration density and complexity in electrical and power electronic systems, serious problems related to electromagnetic interference (EMI) and electromagnetic compatibility (EMC) can occur. For the safety, these disturbing effects must be considered during the electronic equipment design process. One of the concerns on EMC problems is induced by unintentional near-field (NF) radiations. The modeling and measurement of EM NF radiations is one of the bottlenecks which must be overcome by electronic engineers. To predict the unwanted different misbehaviors caused by the EM radiation, NF test benches for the reconstitution of scanning maps at some millimeters of electrical/electronic circuits under test were developed at the IRSEEM laboratory. Due to the difficulty of the design with commercial simulators, the prediction of EM NF emitted by active electronic systems which are usually based on the use of transistors necessitates more relevant and reliable analysis techniques. For this reason, the main focus of this article is on the experimental analysis of EM NF radiated by an MOSFET transistor with changing electrical parameters. Descriptions of the experimental test bench for the EM map scan of transistors radiation are provided. This experimental setup allows not only to detect the EM NF emission but also to analyze the influence of the excitation signal parameters as the cyclic ratio. It is found that the magnetic radiation is maximal when the cyclic ratio is close to 50%. In the future, the technique introduced in this article can be used to evaluate the EM radiation of embedded electronic/electrical devices in order to improve the safety and security of electronic systems.

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Imaging microwave electric fields using a near-field scanning microwave microscope

Abstract: By scanning a fine open-ended coaxial probe above an operating microwave device, we image local electric fields generated by the device at microwave frequencies. The probe is sensitive to the electric flux normal to the face of

Cited by 66 publications

References 9 publications

Characterization of the Open-Ended Coaxial Probe Used for Near-Field Measurements in Emc Applications

Characterization of the Open-Ended Coaxial Probe Used for Near-Field Measurements in Emc Applications

Measurement of electric-field intensities using scanning near-field microwave microscopy

Experimental Investigation on the Power Electronic Transistor Parameters Influence to the Near-Field Radiation for the Emc Applications

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