Proceedings of the 14th International Symposium on Power Semiconductor Devices and Ics
DOI: 10.1109/ispsd.2002.1016212
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I3T80: a 0.35 μm based system-on-chip technology for 42 V battery automotive applications

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Cited by 26 publications
(7 citation statements)
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“…2. The technology of choice for the presented work is the OnSemi I3T80 technology which incorporates a 0.35 µm CMOS process with floating high-voltage quasi-vertical nDMOS and lateral pDMOS transistors [9]. The implemented transistors have a maximum rated bulk drain voltage V bd of 70 V while the supply voltage needed to fully drive the piezoactuator is 72 V. However, the transistors have an avalanche breakdown voltage at or above 78.5 V which is the absolute upper voltage limit when the devices are in the off state.…”
Section: Driver Overview and Chip Technologymentioning
confidence: 99%
“…2. The technology of choice for the presented work is the OnSemi I3T80 technology which incorporates a 0.35 µm CMOS process with floating high-voltage quasi-vertical nDMOS and lateral pDMOS transistors [9]. The implemented transistors have a maximum rated bulk drain voltage V bd of 70 V while the supply voltage needed to fully drive the piezoactuator is 72 V. However, the transistors have an avalanche breakdown voltage at or above 78.5 V which is the absolute upper voltage limit when the devices are in the off state.…”
Section: Driver Overview and Chip Technologymentioning
confidence: 99%
“…The presented PDEMOS is developed for the socalled I3T80 system-on-chip technology from Alcatel Microelectronics [4]. It is based on a 0.35 m standard 3.3 V CMOS platform, consisting of twin retrograde wells in a low doped N-epi on a P-substrate, a thin gate oxide and dual flavoured gates.…”
Section: Process and Device Descriptionmentioning
confidence: 99%
“…I3T50 has a 50V VDMOS transistor with self-aligned channel, as reported in [3]. A more cost effective I3T80 technology node is reported in [4] for an 80V integrated VDMOS transistor, using the Pwell of the standard CMOS as Pbody for the DMOS. The drawback of this option is the strong influence of the parasitic JFET transistor because of the gradually implanted Pwell, resulting in a deep bottleneck between each two adjacent Pbody stripes.…”
Section: Introductionmentioning
confidence: 99%
“…The present work is a continuation of that described in [4], with the objective of reducing the efficiency of the parasitic junction field effect transistor by mean of introducing an anti-JFE implant in the fabrication process. This article summarizes the TCAD and experimental results of this technique when applied for the improvement of an 80V DMOS transistor in I3T80.…”
Section: Introductionmentioning
confidence: 99%