2017
DOI: 10.3390/nano7070158
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I-V and C-V Characterization of a High-Responsivity Graphene/Silicon Photodiode with Embedded MOS Capacitor

Abstract: We study the effect of temperature and light on the I-V and C-V characteristics of a graphene/silicon Schottky diode. The device exhibits a reverse-bias photocurrent exceeding the forward current and achieves a photoresponsivity as high as 2.5 normalA/normalW. We show that the enhanced photocurrent is due to photo-generated carriers injected in the graphene/Si junction from the parasitic graphene/SiO2/Si capacitor connected in parallel to the diode. The same mechanism can occur with thermally generated carrier… Show more

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Cited by 63 publications
(44 citation statements)
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References 20 publications
(24 reference statements)
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“…the formation of an inversion layer in Si 3 . Similar conclusions have been reported in 21,23 , where capacitance-voltage and current-voltage (I-V) measurements were carried out at different temperatures for validation. This fundamental observation of origins of photocurrent generation is a key to further improve the performance of G/Si photodiodes.…”
Section: Introductionsupporting
confidence: 84%
“…the formation of an inversion layer in Si 3 . Similar conclusions have been reported in 21,23 , where capacitance-voltage and current-voltage (I-V) measurements were carried out at different temperatures for validation. This fundamental observation of origins of photocurrent generation is a key to further improve the performance of G/Si photodiodes.…”
Section: Introductionsupporting
confidence: 84%
“…Graphene is commonly produced by exfoliation from graphite [28,29], epitaxial growth on SiC [30] or chemical vapor deposition (CVD) [31,32]. In particular, CVD produces uniform and large-scale graphene flakes of high-quality and is compatible with the silicon technology; therefore, it has been largely exploited to realize new electronic devices such as diodes [33][34][35][36], transistors [37][38][39], field emitters [40,41], chemical-biological sensors [42,43], optoelectronic systems [44], photodetectors [45][46][47][48][49][50] and solar cells [51].…”
Section: Introductionmentioning
confidence: 99%
“…Having a deep insight into the phenomena taking place at those interfaces can give a better understand of the whole solar cell design. For this purpose, several characterization techniques have been studied with the aim of separating the contribution of each interface in the total solar cell behaviour [2][3][4][5][6][7][8]. The most used electrical characterization techniques are based on impedance measurement.…”
Section: Introductionmentioning
confidence: 99%