2006
DOI: 10.1063/1.2364121
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In situ studies of semiconductor nanowire growth using optical reflectometry

Abstract: The authors report the use of in situ optical reflectometry to determine the incubation time for the onset of growth, mean growth rate, and average length of Si nanowires during chemical vapor deposition vapor-liquid-solid synthesis. Results for the constructive and destructive interferences of 635nm linearly polarized laser light scattering from growing nanowire layers are compared to simulations. This real time optical reflectance approach is shown to quantitatively determine nanowire growth rates as well as… Show more

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Cited by 37 publications
(34 citation statements)
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“…Incubation times have indeed been measured before in other type of nanowires. 11,12 In our case, the incubation time is more likely related to the formation of holes in the oxide that host the nucleation of the nanowires. We should also add here that growth directly on a GaAs surface under the same conditions did not result into the formation of nanowires.…”
mentioning
confidence: 75%
“…Incubation times have indeed been measured before in other type of nanowires. 11,12 In our case, the incubation time is more likely related to the formation of holes in the oxide that host the nucleation of the nanowires. We should also add here that growth directly on a GaAs surface under the same conditions did not result into the formation of nanowires.…”
mentioning
confidence: 75%
“…[8][9][10][11][12][13][14] Such a delay has also been revealed for the catalyst-induced growth of silicon and GaN NWs and attributed to the time that is necessary for the supersaturation in the catalyst to reach the critical value. [15][16][17][18][19] In contrast, for the self-induced growth of GaN NWs, the physical origin of the delay in nucleation is still open. It is the aim of this paper to cast a light on the very early stages of the nucleation phase by precisely investigating the incubation time and its evolution with the growth temperature and gallium rate by reflection high-energy electron diffraction (RHEED) measurements.…”
mentioning
confidence: 99%
“…The activation of the VLS mechanism is thus prompt, thanks to the fast Si diffusion through the already liquid particle. Incubation times ranging in the order of several tens of seconds for growth of Si nanowires mediated by Au have been reported, depending of conditions such as temperature and gas phase pressure in thermal CVD processes [9,22]. The activation of the VLS mechanism with Al particles is more difficult than for Indium.…”
Section: Resultsmentioning
confidence: 99%