AlN films were grown on AlN/sapphire templates at 1400–1500 °C using low‐pressure hydride vapor phase epitaxy (LP‐HVPE). Compared to the step‐flow growth of AlN film at 1200 °C with growth rate of 2.1 μm/h, AlN films with atomic steps were obtained at 1400–1500 °C even with high growth rate. For the AlN film grown at 1450 °C with growth rate of 14.3 μm/h, the RMS value is 0.75 nm and the FWHM values of (0002) and (10‐12) X‐ray rocking curve (XRC) are 351 and 781 arcsec, respectively. Since the FWHM value of (10‐12) XRC for the AlN/sapphire template is 1492 arcsec, the crystal quality of HVPE‐grown AlN is greatly improved compared with the AlN/sapphire template, which is also confirmed by TEM observation. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)