HVEM in-situ observations of dislocation behaviour in strongly electron-irradiated nickel

Saka, Hiroyasu; Noda, K.; Matsumoto, K.; Imura, Toru

doi:10.1002/pssa.2210310115

Cited by 13 publications

(1 citation statement)

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“…In nanowires or pillars irradiated intentionally (nuclear nanostructures) or accidentally (FIB manufacturing) and subjected to mechanical loading, the plastic deformation is controlled by the nucleation of dislocations (dislocation source dependent) as well as the interaction of glissile dislocations with point defect clusters generated by irradiation. These interactions were studied experimentally using in situ straining TEM (Saka et al, 1975; Suzuki et al, 1991; Robachy et al, 2003) and predicted using molecular dynamic (MD) and dislocation dynamics simulations (de la Rubia et al, 2000; Osetsky et al, 2000; Zbib et al, 2000) in bulk irradiated materials. Most of these studies showed that SFT can annihilate under applied stress when meeting gliding dislocations.…”

Section: Resultsmentioning

confidence: 99%

Point Defect Clusters and Dislocations in FIB Irradiated Nanocrystalline Aluminum Films: An Electron Tomography and Aberration-Corrected High-Resolution ADF-STEM Study

et al. 2011

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Focused ion beam (FIB) induced damage in nanocrystalline Al thin films has been characterized using advanced transmission electron microscopy techniques. Electron tomography was used to analyze the three-dimensional distribution of point defect clusters induced by FIB milling, as well as their interaction with preexisting dislocations generated by internal stresses in the Al films. The atomic structure of interstitial Frank loops induced by irradiation, as well as the core structure of Frank dislocations, has been resolved with aberration-corrected high-resolution annular dark-field scanning TEM. The combination of both techniques constitutes a powerful tool for the study of the intrinsic structural properties of point defect clusters as well as the interaction of these defects with preexisting or deformation dislocations in irradiated bulk or nanostructured materials.

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Section: Resultsmentioning

confidence: 99%

Point Defect Clusters and Dislocations in FIB Irradiated Nanocrystalline Aluminum Films: An Electron Tomography and Aberration-Corrected High-Resolution ADF-STEM Study

et al. 2011

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Possibilities for In‐situ Observation of Basic Deformation Processes and of Other Dynamic Processes

Imura

1979

Cryst Res and Technol

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The purposes of this paper are to discuss the possibilities of HVEM in-situ observation for deriving meaningful results on basic deformation processes by illustrating some examples which have been obtainecl so far and to assess the capabilities of this method to investigate crystal deforniation as well as other dynamic processes. First, the experimental procedures tleveloprrl by our group in Nagoya to study the tlynarnic behaviour of dislocations are introduced. Research subjects which have been studied effectively by this method so far are illustrated. The lower safety limit of s p e~h i e n thickness for deriving information typical of bulk materials, the effects of size ancl free surfaces of a specimen and the effects of electron irradiation etc. are to be discusfit-(1 to aesess the validity of in situ observation of dislocation behaviours. Some prospects on new applications and extensions of in-situ HVEM for physical and niaterials research are to be presented, including possibilities for in-situ observation of other subjects such as diffusion, environititmtcal effects, interface reaction, c-hernicd reaction, clefect formation during growing or processing of seini-c.onductors, surfwe treatment ant1 micro fabrication by electron beam rtc.Die Mliglichkeiten cler In-sitii-Hlichstspannungs-Elektronenmik~skopie bei der Untersuchung von Deforniationsprozessen werden anhand von Beispielen erliiutert. Die Verwendbarkeit dieser Methode fur die Untersuchung der Deformation von Kristallen und fur andere dynamische Prozesse wird untersucht. Die in Nagoya fur die Beobachtung des tlynamischen Verhaltens von Versetzungen entwickelten Verfahren werden vorgestellt, und die bisher mit diesem Verfahren untersuchten Themen werden diskutiert. Die Mindestprobendicke, bei der die Gewinnung von Informationen, die fur des Vollmaterial typisch sind, noch moglich ist, sowie die Einflusse der Gro13e und der freien Oberfliiche einer Probe und auch der Elektronenbestrahlung werden hinsichtlich der Gultigkeit der In-situBeobachtungen des Versetzungsverhaltens abgeschiitzt. Es werden einige neue Anwendungen und Erweiterungen der In-situ-Hochstspannungs-Elektronenmikroskopie auf dem Gebiet der physikalischen und der Materialforschung angegeben, einschlieSlich der Moglichkeiten der In-situ-Beobachtungen anderer Themen wie z. B. Diffusion, EinfluS der Umgebung der Probe, Interface-Reaktionen, chemische Reektionen, Bildung von Defekten wahrend der Zuchtung und der Verarbeitung von Halbleitern, Oberfliichenbehandlung und Elektronenstrahl-Mikrobearbeitung.

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HVEM In‐situ Deformation Investigations on Cyclically Deformed Nickel Single Crystal

Mecke¹,

Messerschmidt²

1979

Cryst Res and Technol

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In‐situ deformation investigations were carried out on thin foils of a nickel single crystal which was cyclically pre‐deformed. The motion of dislocations does not start in the whole specimen simultaneously but begins at localized places in the dislocation‐poor regions. The plastic deformation may be characterized by a collective movement of dislocations. Measurements of the effective stress show its characteristic dependence on the position in the direction of the Burgers vector. There are clear indications of structural changes in the dense regions of dislocations at strains exceeding the cyclic total strain amplitude.

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HVEM in-situ observations of dislocation behaviour in strongly electron-irradiated nickel

Cited by 13 publications

References 10 publications

Point Defect Clusters and Dislocations in FIB Irradiated Nanocrystalline Aluminum Films: An Electron Tomography and Aberration-Corrected High-Resolution ADF-STEM Study

Point Defect Clusters and Dislocations in FIB Irradiated Nanocrystalline Aluminum Films: An Electron Tomography and Aberration-Corrected High-Resolution ADF-STEM Study

Possibilities for In‐situ Observation of Basic Deformation Processes and of Other Dynamic Processes

HVEM In‐situ Deformation Investigations on Cyclically Deformed Nickel Single Crystal

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