1989
DOI: 10.1063/1.101314
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Hole transport through minibands of a symmetrically strained GexSi1−x/Si superlattice

Abstract: The hole transport through the minibands of a GexSi1−x/Si superlattice is observed for the first time. The symmetrically strained, short-period GexSi1−x/Si supperlattice is grown on a Gex/2Si1−x/2 /Si buffer layer. The current-voltage and conductance-voltage characteristics show two peaks which are attributed to the conduction of light holes through the first and second light hole minibands. The light hole miniband energies are estimated by thermionic emission analysis and are in good agreement with the calcul… Show more

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Cited by 33 publications
(1 citation statement)
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“…There have been several attempts to improve the performance of Si-based devices, such as hetero-junction bipolar transistors and modulation-doped field effect transistors, by using SiGe alloys (People 1986; Iyer et al 1989; Park et al 1989). Since one of the most advantageous features in Si devices is the availability of good quality oxide, prepared by thermal oxidation and its interface with substrate, control of oxidation process is a key technology for future SiGe-based devices.…”
Section: Fabrication Of Novel Nanometre Sized Multilayer Structures Tmentioning
confidence: 99%
“…There have been several attempts to improve the performance of Si-based devices, such as hetero-junction bipolar transistors and modulation-doped field effect transistors, by using SiGe alloys (People 1986; Iyer et al 1989; Park et al 1989). Since one of the most advantageous features in Si devices is the availability of good quality oxide, prepared by thermal oxidation and its interface with substrate, control of oxidation process is a key technology for future SiGe-based devices.…”
Section: Fabrication Of Novel Nanometre Sized Multilayer Structures Tmentioning
confidence: 99%