Studies of interdiffusion in GemSin strained layer superlattices

Chang, Shoou‐Jinn; Wang, K. L.; Bowman, Robert C.; Adams, P. M.; Nayak, Deepak Kumar; Woo, J.C.S.

doi:10.1007/bf02651736

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Experimental Results and Mrox Simulations1

Crystengcomm Paper1

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1991

2023

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Cited by 12 publications

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“…In fact, according to the literature, a low degree of interdiffusion is common in Si/Ge superlattices. 48–50 The composition heterogeneities would change the mass density depth-distribution but the total thickness of a set of Si/Si 1− x Ge x /Ge/Si 1− x Ge x layers would be kept constant. The result is accurately simulated KFs, i.e.…”

Section: Experimental Results and Mrox Simulationsmentioning

confidence: 99%

“…In fact, according to the literature, a low degree of interdiffusion is common in Si/Ge superlattices. [48][49][50] The composition heterogeneities would change the mass density depthdistribution but the total thickness of a set of Si/Si 1−x Ge x /Ge/ Si 1−x Ge x layers would be kept constant. The result is accurately simulated KFs, i.e., no simulated fringes would be out-of-phase with respect to the experimental ones because the total thickness is maintained, while affecting the KF and SL overall intensity.…”

Section: Crystengcomm Papermentioning

confidence: 99%

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