We report electric-field-induced switching with write energies down to 6 fJ/bit for switching times of 0.5 ns, in nanoscale perpendicular magnetic tunnel junctions (MTJs) with high resistance-area product and diameters down to 50 nm. The ultra-low switching energy is made possible by a thick MgO barrier that ensures negligible spin-transfer torque contributions, along with a reduction of the Ohmic dissipation. We find that the switching voltage and time are insensitive to the junction diameter for high-resistance MTJs, a result accounted for by a macrospin model of purely voltageinduced switching. The measured performance enables integration with same-size CMOS transistors in compact memory and logic integrated circuits. V

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Thermoelectric properties, i.e., thermal conductivity, electrical conductivity, and the Seebeck coefficient, have been measured in the directions parallel (in-plane) and perpendicular to the interface of an n-type Si(80 Å)/Ge(20 Å) superlattice. A two-wire 3ω method is employed to measure the in-plane and cross-plane thermal conductivities. The cross-plane Seebeck coefficient is deduced by using a differential measurement between the superlattice and reference samples and the cross-plane electrical conductivity is determined through a modified transmission-line method. The in-plane thermal conductivity of the Si/Ge superlattice is 5–6 times higher than the cross-plane one, and the electrical conductivity shows a similar anisotropy. The anisotropy of the Seebeck coefficients is smaller in comparison to electrical and thermal conductivities in the temperature range from 150 to 300 K. However, the cross-plane Seebeck coefficient rises faster with increasing temperature than that of the in-plane direction.

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We present in-plane CoFeB–MgO magnetic tunnel junctions with perpendicular magnetic anisotropy in the free layer to reduce the spin transfer induced switching current. The tunneling magnetoresistance ratio, resistance-area product, and switching current densities are compared in magnetic tunnel junctions with different CoFeB compositions. The effects of CoFeB free layer thickness on its magnetic anisotropy and current-induced switching characteristics are studied by vibrating sample magnetometry and electrical transport measurements on patterned elliptical nanopillar devices. Switching current densities ∼4 MA/cm2 are obtained at 10 ns write times.

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We show that adding a perpendicular polarizer to a conventional spin torque memory element with an in-plane free layer and an in-plane polarizer can significantly increase the write speed and decrease the write energy of the element. We demonstrate the operation of such spin torque memory elements with write energies of 0.4 pJ and write times of 0.12 ns.