1994
DOI: 10.1049/el:19940970
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High power COD-free operation of 0.98 µm InGaAs/GaAs/InGaP lasers with non-injection regions near the facets

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Cited by 22 publications
(7 citation statements)
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“…Several methods have been successfully incorporated to both increase the initial COD limit and to minimize its decrease as the device is operated. These methods are the use of aluminum-free materials either in the active layer or in the waveguide layers [3] , the use of a window region at the facets that is transparent at the lasing wavelength non-absorbing mirror [4] , and the use of a passivation layer that limits chemical reactions or point-defect migration [5] . Increasing cavity length also improves the COD limit as well as the long-term reliability.…”
Section: Device Characterizationmentioning
confidence: 99%
“…Several methods have been successfully incorporated to both increase the initial COD limit and to minimize its decrease as the device is operated. These methods are the use of aluminum-free materials either in the active layer or in the waveguide layers [3] , the use of a window region at the facets that is transparent at the lasing wavelength non-absorbing mirror [4] , and the use of a passivation layer that limits chemical reactions or point-defect migration [5] . Increasing cavity length also improves the COD limit as well as the long-term reliability.…”
Section: Device Characterizationmentioning
confidence: 99%
“…Oxidation of the facets in laser diodes made from aluminum-containing materials has been shown to be the major contributor to the non-radiative recombination process [14,17]. Techniques such as adding passivation layers to protect facets [18], cleaving and coating facets in high vacuum [18], creating non-absorbing windows close to the facets [19] have been implemented to reduce COMD. The COD failure mode can be revealed by the destructive techniques of chemical etching and plane-view electron-beam induced current (EBIC) imaging.…”
Section: Device Reliabilitymentioning
confidence: 99%
“…Oxidation of the facets of laser diodes made from aluminum-containgin materials has been shown to be the major contributor to the non-radiative recombination process [17,21]. Techniques such as adding passivation layers to protect facets [22], cleaving and coating facets in high vacuum [22], creating non-absorbing windows close to the facets [23] have been implemented to reduce COMD. Since the active layer in our 915 nm laser diodes is AlGaInAs, a Al-containing material, the reliability of these devices are of concern.…”
Section: Device Reliabilitymentioning
confidence: 99%