1996
DOI: 10.1109/23.556892
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Heavy ion and proton induced single event transients in comparators

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Cited by 47 publications
(9 citation statements)
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“…Single-event transients (SETs) are produced by linear circuits when they are exposed to high-energy charged particles that deposit sufficient energy near internal p-n junctions in critical regions of the circuit. A number of papers have addressed transients in analog microcircuits [1][2][3][4][5], as well as in optocouplers [6,7]. Transients in differential comparators are often more important than transients in operational amplifiers because comparators usually drive digital circuits that can be triggered into an erroneous condition from a single short-duration transient, particularly if the circuit application is asynchronous.…”
Section: Introductionmentioning
confidence: 99%
“…Single-event transients (SETs) are produced by linear circuits when they are exposed to high-energy charged particles that deposit sufficient energy near internal p-n junctions in critical regions of the circuit. A number of papers have addressed transients in analog microcircuits [1][2][3][4][5], as well as in optocouplers [6,7]. Transients in differential comparators are often more important than transients in operational amplifiers because comparators usually drive digital circuits that can be triggered into an erroneous condition from a single short-duration transient, particularly if the circuit application is asynchronous.…”
Section: Introductionmentioning
confidence: 99%
“…Satellite system designers and parts engineers, however, are not always aware of single event transient issues. Over the past few years, several publications have noted the effects of SETs in linear devices [3][4][5], combinational logic [6][7][8], and optical subsystems [9][10][11][12][13][14][15][16][17][18][19][20]. The optocoupler, being a combination of an optical system and a linear device, has not previously been investigated in this regard.…”
Section: Introductionmentioning
confidence: 99%
“…In the case of the LM139, the product went through a die shrink after the majority of SET testing was done [2]- [4], [11]- [14], [17]. The different die revisions have been shown to have some differences in SET sensitivities and those sensitivities can vary with operating conditions.…”
Section: Conclusion and Additional Testingmentioning
confidence: 99%
“…Each supplier may have used a number of different product layouts, manufacturing locations and processes to produce these products over the years. Previous SET testing on different versions of the LM139 has shown that the SET response can depend upon the product's manufacturing origin, such as manufacturer and wafer fabrication facility (fab) [2]- [4].…”
Section: Introductionmentioning
confidence: 99%