Single Event Transient (SET) Response of National Semiconductor's ELDRS-Free LM139 Quad Comparator

Kruckmeyer, Kirby; Büchner, S.; DasGupta, Sandeepan

doi:10.1109/redw.2009.5336313

Cited by 5 publications

(1 citation statement)

References 12 publications

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“…However, some additional details can minimize the significance of these unwanted events. Single event transients in comparator strongly depend on the input voltage difference since the cross section decreases two orders of magnitude or more in case of using voltage differences on the order of volts [19], [20]. Besides, common sense can help to discriminate some supposed events.…”

Section: Trigger Of Comparatorsmentioning

confidence: 99%

Defining a strategy to perform life-tests with analog devices

Franco

Palomar

Liu

et al. 2011

2011 12th European Conference on Radiation and Its Effects on Components and Systems

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Abstract-Unlike for memory elements inside integrated circuits, scarce life tests have been performed to study single event transients in discrete analog devices. The reason is that life tests require a large amount of samples to be stored for having enough data allowing statistical conclusions and, usually, single event transients are captured by means of oscilloscopes. In this paper, we propose a strategy to carry out life tests in analog voltage comparators by means of digital programmable device that can detect anomalous pulses in the voltage comparator. Besides, the idea on which this kind of tests relies can be extended to be used with other families of analog devices, such as operational amplifiers, voltage references, etc.

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Section: Trigger Of Comparatorsmentioning

confidence: 99%