Hard X-Ray Nanoprobe based on Refractive X-Ray Lenses

In situ identification of a CAI candidate in 81P/Wild 2 cometary dust by confocal high resolution synchrotron X-ray fluorescence

“…A high spatial resolution of some hundred nm (in best cases less than 50 nm (Schroer et al, 2005)) can be obtained with still sufficiently high photon flux on the ID13 beamline at the ERSF. It is further demonstrated that by using a confocal set-up, it is possible to minimize the amount of fluorescence signal from the surrounding aerogel matrix.…”

“…The set-up was installed at the nanofocussing beamline ID13. SR from second and third generation sources offer the possibility of non-destructive multielement analysis with high spatial resolution (see also: Schroer et al, 2005) down to trace element concentrations with relative detection limits (DL) at the sub-ppm range and absolute DL below 1 fg.…”

Fluorescence-based knife-edge beam diameter measurement to characterize X-ray beam profiles in reflection geometry

“…Finally, the diameter is defined as the Full-Width at Half Maximum (FWHM) of the signal presented in Fig. 3b [18,21,28]. We thus obtained a diameter along the horizontal scanning axis close to 3.5 mm and about 2.9 mm for the diameter along the vertical scanning axis.…”

“…This technique is generally based on transmission geometry and the transmitted photon flux of the beam is measured as a function of the edge position occulting step by step the X-ray beam [14][15][16][17]. Moreover, since X-ray beams can potentially induce X-ray fluorescence, the fluorescence signal emitted by the knife-edge has also been exploited either in transmission [18][19][20][21] or in reflection geometry [22][23][24] in order to characterize micrometric and sub-micrometric X-ray beams. However, while X-ray beams are very well characterized by experts in this field, most of the widespread handheld systems suffer from insufficient characterization.…”

Multilayer Fresnel Zone Plate with High-Diffraction Efficiency: Application of Composite Layer to X-Ray Optics

“…, [2] (Hayakawa et al, 1989), [3] (Underwood et al, 1988), [4] (Mimura et al, 2010), [5] , [6][7] 2007), [8] (Snigirev et al, 1996), [9] (Lengeler et al, 1999), [10] , [11] (Nazmov et al, 2005), [12] (Schroer et al, 2006), [13] (Schroer et al, 2005), [14] (Kang et al, 2008), [15] (Koyama et al, 2010a), [16] (Koyama et al, 2010b), [17] (Lai et al, 1992), [18] (Shastri et al, 2001), [19] (Fabrizio et al, 1999a), [20] (Fabrizio et al, 1999b), [21] (Chu et al, 2008), [22] , [23] (Suzuki et al, 2010), [24] (Saitoh et al, 1988), [25] (Saitoh et al, 1989), [26] , [27] , [28] (Kamijo et al, 2002a), [29] (Kamijo et al, 2002b), [30] , …”