2008
DOI: 10.1002/pssc.200778433
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Growth of thin protective AlN layers on sapphire substrates at 1065 °C for hydride vapor phase epitaxy of AlN above 1300 °C

Abstract: A thin protective AlN layer was grown on a (0001) sapphire substrate at 1065 °C for main AlN layer growth at high temperature (> 1300 °C) by hydride vapor phase epitaxy (HVPE). The formation of surface pits on the surface of the epitaxial AlN layer, grown directly on the sapphire substrate at 1320 °C, could be prevented by growing the protective layer. The full‐width at half‐maximum (FWHM) of X‐ray diffraction (XRD) rocking curves of asymmetric (10 $\bar 1$ 0) and symmetric (0002) AlN decreased to 19.8 and 9.6… Show more

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Cited by 19 publications
(22 citation statements)
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“…Also, the growth mode might be changed from three-dimensional (3D) to twodimensional (2D) mode during high-temperature growth. Several group reported the mode change from 3D to 2D by applying the change of V/III ratio, high growth temperature, or insertion of interlayer facilitates the bending of dislocations [13][14][15]. According to the reports of Gay et al [16] and Usui et al [17], we can roughly estimate the dislocation density of screw-and edge dislocations to be 1.1 Â10 7 and 1.9 Â 10 9 cm À2 , respectively.…”
Section: Resultsmentioning
confidence: 80%
See 1 more Smart Citation
“…Also, the growth mode might be changed from three-dimensional (3D) to twodimensional (2D) mode during high-temperature growth. Several group reported the mode change from 3D to 2D by applying the change of V/III ratio, high growth temperature, or insertion of interlayer facilitates the bending of dislocations [13][14][15]. According to the reports of Gay et al [16] and Usui et al [17], we can roughly estimate the dislocation density of screw-and edge dislocations to be 1.1 Â10 7 and 1.9 Â 10 9 cm À2 , respectively.…”
Section: Resultsmentioning
confidence: 80%
“…3. Therefore, intermediate layer such as middletemperature AlN protective layer [15] is essential to obtain a highquality AlN layer at high temperatures.…”
Section: Resultsmentioning
confidence: 99%
“…Several techniques for growing aluminum nitride layers on a variety of substrates have AlN deposition requires a high growth temperature above 1200 • C [14,17]. Nevertheless, thermal decomposition of c-plane sapphire starts to occur at 1200 • C [18] and AlN starts to decompose around 1400 • C [19] by reacting with hydrogen (H 2 ) used as a carrier gas, resulting in the formation of surface pits and in the degradation of AlN layer quality [20].…”
Section: Introductionmentioning
confidence: 99%
“…Therefore, HVPE of a thick AlN layer on a foreign substrate is one of the promising approaches for preparation of a freestanding AlN substrate or an AlN template [9][10][11][12][13] because of its high growth rate and scalability for large area growth. Our group has recently succeeded in using HVPE for growing AlN layers on a sapphire substrate above 1200 1C by growing a thin protective AlN layer at 1065 1C to suppress surface decomposition of the sapphire substrate [13]. However, the crystalline quality of the AlN layers was unsatisfactory, and cracking of the AlN layer with thickness of several tens of micrometers on sapphire substrate became another problem.…”
Section: Introductionmentioning
confidence: 99%