2008
DOI: 10.1109/led.2007.911974
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Gate Fringe-Induced Barrier Lowering in Underlap FinFET Structures and Its Optimization

Abstract: Abstract-The difficulty to fabricate and control precisely defined doping profiles in the source/drain underlap regions of FinFETs necessitates the use of undoped gate underlap regions as the technology scales down. We present a phenomenon called the gate fringe-induced barrier lowering (GFIBL) in FinFETs with undoped underlap regions. In these FinFETs, we show that the GFIBL can be effectively used to improve I on . We propose the use of high-κ spacers in such FinFETs to enhance the effect of GFIBL and thereb… Show more

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Cited by 117 publications
(53 citation statements)
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“…In this work, we have incorporated the symmetric high-k spacer (SHS) in the underlap regions near S/D side of the hybrid FinFET. Previously, the underlap FinFETs have already earned very good control over SCEs [13,14]. Similarly, Pal et al [1,2] have proposed that excellent control over channel and significant improvement in I on and I off are achievable with contemplate dual-k spacers in the underlap region.…”
Section: Introductionmentioning
confidence: 99%
“…In this work, we have incorporated the symmetric high-k spacer (SHS) in the underlap regions near S/D side of the hybrid FinFET. Previously, the underlap FinFETs have already earned very good control over SCEs [13,14]. Similarly, Pal et al [1,2] have proposed that excellent control over channel and significant improvement in I on and I off are achievable with contemplate dual-k spacers in the underlap region.…”
Section: Introductionmentioning
confidence: 99%
“…Gate fringe induced barrier lowering (GFIBL) is observed in undoped underlap FinFETs with an increase in the dielectric constant of spacer region (L ext ) [12]. The barrier to lateral drain electric field is lowered in strong inversion because of increase in the coupling of gate fringing fields to undoped underlap portion of FinFET.…”
Section: Resultsmentioning
confidence: 99%
“…Therefore, analysis is carried out at 8 nm of fin thickness (T fin ). High dielectric (High-k) spacers in underlap FinFET are reported to modulate the barrier in undoped underlap length of FinFETs [12]. The barrier modulation is a direct consequence of increase in gate fringing field which shifts the lateral electric field at the gate edge toward drain.…”
Section: Introductionmentioning
confidence: 99%
“…The 2-D FinFET structure shown in Fig. 1 [25] was used for the simulations. In Sentaurus, the drift-diffusion mobility and density-gradient quantum correction models were enabled.…”
Section: Characteristics Of Low and High-v Th Devicesmentioning
confidence: 99%