2016
DOI: 10.1063/1.4972182
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GaN-based vertical-cavity surface emitting lasers with sub-milliamp threshold and small divergence angle

Abstract: A GaN-based vertical-cavity surface emitting laser (VCSEL) structure featuring a silicon-diffusion-defined current blocking layer for lateral confinement is described. Sub-milliamp threshold currents were achieved for both 3- and 5-μm-aperture VCSELs under continuous-wave operation at room temperature. The vertical cavity was defined by a top dielectric distributed Bragg reflector (DBR) and a bottom epitaxial DBR. The emission spectrum exhibited a single peak at 411.2 nm with a linewidth of 0.4 nm and a side m… Show more

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Cited by 47 publications
(26 citation statements)
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“…3D). The measured lasing threshold is significantly lower compared to previously reported GaN VCSELs ( 22 , 26 , 27 , 40 , 60 , 61 ). An output power of ~12 μW was measured at an injection current density of ~1 kA/cm 2 under CW operation.…”
Section: Resultscontrasting
confidence: 66%
“…3D). The measured lasing threshold is significantly lower compared to previously reported GaN VCSELs ( 22 , 26 , 27 , 40 , 60 , 61 ). An output power of ~12 μW was measured at an injection current density of ~1 kA/cm 2 under CW operation.…”
Section: Resultscontrasting
confidence: 66%
“…In 2016, Yeh et al proposed a low-threshold VCSEL with small divergence angle. [87] The VCSEL was featured by a Si-diffusion-defined current blocking layer, where a 3D current confinement structure could effectively prevent the current spreading laterally. The top DBR were 8-pair TiO 2 /SiO 2 with a maximum reflectivity of 99% and a stopband width of 120 nm.…”
Section: Hybrid Dielectric and Aln/gan Dbrmentioning
confidence: 99%
“…[1][2][3] In particular, III-nitride VCSELs have attracted much interest owing to their unique emission wavelengths (ultraviolet to green) for attractive applications, such as visible light communication, optical sensors, displays, and atomic clocks. [4][5][6][7][8][9] Reports of III-nitride VCSELs have consisted of hybrid epitaxial=dielectric 10,11) and dual dielectric DBR designs. [7][8][9][12][13][14] Both designs have required intracavity contacts, and indium tin oxide (ITO) has been the most commonly used material to improve lateral current spreading on the p-side.…”
Section: ++mentioning
confidence: 99%