2014
DOI: 10.1063/1.4895050
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Ferroelectric properties in thin film barium titanate grown using pulsed laser deposition

Abstract: The characteristics of polycrystalline BaTiO3 metal-insulator-metal capacitors, fabricated using pulsed laser deposition, are investigated from room temperature to 420 K. The capacitance–voltage characteristics show ferroelectric behaviour at room temperature, with a phase transition to paraelectric at higher temperature. However, the permittivity response shows paraelectric behaviour across all measured temperatures. So BaTiO3 exists here in a mixture of cubic and tetragonal phases. The BaTiO3 films have a co… Show more

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Cited by 30 publications
(14 citation statements)
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“…The Pt/BTO/ITO structure exhibits rather symmetric hysteresis loops with an average P r of 8.9 μC/cm 2 , P s of 9.7 μC/cm 2 and E c of 64.2 kV/cm. The obtained P r value is higher than the values found in literature for polycrystalline BTO thin films grown by pulsed laser deposition (PLD) method 20 , which can be explained by the highly ( 111 )-oriented texture of BTO films. This is in good agreement with literature 31 32 .…”
Section: Resultscontrasting
confidence: 78%
See 1 more Smart Citation
“…The Pt/BTO/ITO structure exhibits rather symmetric hysteresis loops with an average P r of 8.9 μC/cm 2 , P s of 9.7 μC/cm 2 and E c of 64.2 kV/cm. The obtained P r value is higher than the values found in literature for polycrystalline BTO thin films grown by pulsed laser deposition (PLD) method 20 , which can be explained by the highly ( 111 )-oriented texture of BTO films. This is in good agreement with literature 31 32 .…”
Section: Resultscontrasting
confidence: 78%
“…The absence of Al 2 O 3 peaks in XRD could be due to its amorphous nature. The presence of clear splitting of the BTO ( 200 ) peak around 2θ ≈ 44.5° in Pt/BTO confirms the tetragonal symmetry of the BTO layer at room temperature20. The extended scans of GIXRD around 2θ ≈ 44.5° are shown in Fig.…”
Section: Resultssupporting
confidence: 58%
“…The C – V behavior of the MIM capacitors based on the as deposited BST film reported in Figure , is in good agreement with results reported in literature on MIM capacitors based on non‐linear insulating material . The demonstrated capacitance density reaches 0.9 μF cm −2 at 0.4 V (curve without annealing).…”
Section: Mim Capacitors Fabrication and Electrical Performancessupporting
confidence: 89%
“…This can be confirmed by our PFM measurements ( Figure S3) as well as by the results reported in other work. 53 The non-uniform distribution of both magnetostrictive and piezoelectric domains results in a random distribution of ME active sites. Third, differences in the ME layer thickness on the microsphere also contribute to the non-uniform distribution of ME active sites.…”
Section: Conceptual Insightsmentioning
confidence: 99%