Fast time-resolved electrostatic force microscopy: Achieving sub-cycle time resolution

Karatay, Durmus U.; Harrison, Jeffrey S.; Glaz, Micah S.; Giridharagopal, Rajiv; Ginger, David S.

doi:10.1063/1.4948396

Cited by 47 publications

(95 citation statements)

References 56 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…III-V, the capacitive charge redistribution times are much faster than one cantilever cycle and voltage drops across the resistances (i.e., the left hand sides of Eqs. (46)(47)(48)) are negligible. Taking the resistances in the equations of motion to zero independently implements this fast-charging limit.…”

Section: B a More General Efm Modelmentioning

confidence: 98%

“…1 iments the response of ions to a step-change in tip voltage is tracked in real time through a shift in cantilever frequency [37][38][39][40][41][42]. EFM has been used to follow the time evolution of photocapacitance in response to illumination [43][44][45][46]. These experiments have pushed the limits of time resolution in EFM, with claimed time resolutions down to less than 1 percent of the cantilever period [46].…”

Section: Introductionmentioning

confidence: 99%

“…EFM has been used to follow the time evolution of photocapacitance in response to illumination [43][44][45][46]. These experiments have pushed the limits of time resolution in EFM, with claimed time resolutions down to less than 1 percent of the cantilever period [46]. These EFM photocapacitance experiments stand in contrast to scanning probe microscopy-based variants of optical pump probe techniques, which exploit a nonlinearity to infer ultrafast dynamics by measuring differences in a time-averaged quantity versus a pulse time, delay, or frequency [47,48].…”

Section: Introductionmentioning

confidence: 99%

“…The left side of Fig. 3 shows the feedback-free time-resolved electric force microscopy (FF-trEFM) experiment [46] and the right side shows the phasekick electric force microscopy (pk-EFM) experiment [55]. The objective of both experiments is to observe the temporal dynamics of light-induced changes in a semiconductor sample's capacitance.…”

Section: Introductionmentioning

confidence: 99%

“…55 and the feedback-free time-resolved electric force microscopy (FF-trEFM) experiment of Ref. 46 using a common formalism ( Figs. 3 and 4).…”

Section: Introductionmentioning

confidence: 99%

See 4 more Smart Citations

Lagrangian and Impedance-Spectroscopy Treatments of Electric Force Microscopy

2019

View full text Add to dashboard Cite

Scanning probe microscopy is often extended beyond simple topographic imaging to study electrical forces and sample properties, with the most widely used experiment being frequency-modulated Kelvin probe force microscopy. The equations commonly used to interpret this frequency-modulated experiment, however, rely on two hidden assumptions. The first assumption is that the tip charge oscillates in phase with the cantilever motion to keep the tip voltage constant. The second assumption is that any changes in the tip-sample interaction happen slowly. Starting from an electro-mechanical model of the cantilever-sample interaction, we use Lagrangian mechanics to derive coupled equations of motion for the cantilever position and charge. We solve these equations analytically using perturbation theory, and, for verification, numerically. This general approach rigorously describes scanned probe experiments even in the case when the usual assumptions of fast tip charging and slowly changing samples properties are violated. We develop a Magnus-expansion approximation to illustrate how abrupt changes in the tip-sample interaction cause abrupt changes in the cantilever amplitude and phase. We show that feedback-free time-resolved electric force microscopy cannot uniquely determine sub-cycle photocapacitance dynamics. We then use first-order perturbation theory to relate cantilever frequency shift and dissipation to the sample impedance even when the tip charge oscillates out of phase with the cantilever motion. Analogous to the treatment of impedance spectroscopy in electrochemistry, we apply this approximation to determine the cantilever frequency shift and dissipation for an arbitrary sample impedance in both local dielectric spectroscopy and broadband local dielectric spectroscopy experiments. The general approaches we develop provide a path forward for rigorously modeling the coupled motion of the cantilever position and charge in the wide range of electrical scanned probe microscopy experiments where the hidden assumptions of the conventional equations are violated or inapplicable. arXiv:1807.01219v2 [cond-mat.mes-hall]

show abstract

Section: B a More General Efm Modelmentioning

confidence: 98%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

“…55 and the feedback-free time-resolved electric force microscopy (FF-trEFM) experiment of Ref. 46 using a common formalism ( Figs. 3 and 4).…”

Section: Introductionmentioning

confidence: 99%

See 3 more Smart Citations

Lagrangian and Impedance-Spectroscopy Treatments of Electric Force Microscopy

2019

View full text Add to dashboard Cite

show abstract

Functional Scanning Force Microscopy for Energy Nanodevices

et al. 2018

View full text Add to dashboard Cite

Energy nanodevices, including energy conversion and energy storage devices, have become a major cross-disciplinary field in recent years. These devices feature long-range electron and ion transport coupled with chemical transformation, which call for novel characterization tools to understand device operation mechanisms. In this context, recent developments in functional scanning force microscopy techniques and their application in thin-film photovoltaic devices and lithium batteries are reviewed. The advantages of scanning force microscopy, such as high spatial resolution, multimodal imaging, and the possibility of in situ and in operando imaging, are emphasized. The survey indicates that functional scanning force microscopy is making significant contributions in understanding materials and interfaces in energy nanodevices.

show abstract

Probing of Local Multifield Coupling Phenomena of Advanced Materials by Scanning Probe Microscopy Techniques

Zeng

2018

Advanced Materials

View full text Add to dashboard Cite

The characterization of the local multifield coupling phenomenon (MCP) in various functional/structural materials by using scanning probe microscopy (SPM)-based techniques is comprehensively reviewed. Understanding MCP has great scientific and engineering significance in materials science and engineering, as in many practical applications, materials and devices are operated under a combination of multiple physical fields, such as electric, magnetic, optical, chemical and force fields, and working environments, such as different atmospheres, large temperature fluctuations, humidity, or acidic space. The materials' responses to the synergetic effects of the multifield (physical and environmental) determine the functionalities, performance, lifetime of the materials, and even the devices' manufacturing. SPM techniques are effective and powerful tools to characterize the local effects of MCP. Here, an introduction of the local MCP, the descriptions of several important SPM techniques, especially the electrical, mechanical, chemical, and optical related techniques, and the applications of SPM techniques to investigate the local phenomena and mechanisms in oxide materials, energy materials, biomaterials, and supramolecular materials are covered. Finally, an outlook of the MCP and SPM techniques in materials research is discussed.Multifield Coupling temperature, moisture, and atmosphere. The studies of multifield coupling phenomena (MCP) are important for functional and structural materials because they are often operated under several external stimuli simultaneously in real applications. In the area of multifield coupling, a group of researchers have dedicated to the computational and modeling works in order to explain

show abstract

Fast time-resolved electrostatic force microscopy: Achieving sub-cycle time resolution

Cited by 47 publications

References 56 publications

Lagrangian and Impedance-Spectroscopy Treatments of Electric Force Microscopy

Lagrangian and Impedance-Spectroscopy Treatments of Electric Force Microscopy

Functional Scanning Force Microscopy for Energy Nanodevices

Probing of Local Multifield Coupling Phenomena of Advanced Materials by Scanning Probe Microscopy Techniques

Contact Info

Product

Resources

About