2018
DOI: 10.1002/adma.201802490
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Functional Scanning Force Microscopy for Energy Nanodevices

Abstract: Energy nanodevices, including energy conversion and energy storage devices, have become a major cross-disciplinary field in recent years. These devices feature long-range electron and ion transport coupled with chemical transformation, which call for novel characterization tools to understand device operation mechanisms. In this context, recent developments in functional scanning force microscopy techniques and their application in thin-film photovoltaic devices and lithium batteries are reviewed. The advantag… Show more

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Cited by 42 publications
(26 citation statements)
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References 263 publications
(317 reference statements)
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“…Although highly sensitive, it is not expected that AFM techniques can be integrated into drying metrology measurements due to the high sensitivity of the machine to vibrations. Advanced AFM systems not only probing surface properties such as morphology, [ 56 ] but also mechanical (e.g., elastic modulus), [ 57 ] electrical (e.g., conductivity, permittivity), [ 58 ] functional properties [ 59 ] (e.g., piezoelectric response), etc. [ 56a ]…”
Section: Electrode Drying Metrologymentioning
confidence: 99%
“…Although highly sensitive, it is not expected that AFM techniques can be integrated into drying metrology measurements due to the high sensitivity of the machine to vibrations. Advanced AFM systems not only probing surface properties such as morphology, [ 56 ] but also mechanical (e.g., elastic modulus), [ 57 ] electrical (e.g., conductivity, permittivity), [ 58 ] functional properties [ 59 ] (e.g., piezoelectric response), etc. [ 56a ]…”
Section: Electrode Drying Metrologymentioning
confidence: 99%
“…These broadly fall into two categories; those that rely on electrochemical processes or ionic transport, such as scanning electrochemical microscopy (SECM), [ 302–305 ] scanning ion conductance microscopy (SICM), [ 306 ] scanning electrochemical cell microscopy (SECCM) [ 307 ] and electrochemical strain microscopy (ESM); [ 308–311 ] and those that probe properties intrinsic to the electrode material, like Kelvin probe force microscopy (KPFM) [ 312,313 ] and electrostatic force microscopy (EFM). [ 314 ] These techniques, and their application to study battery materials, have been reviewed elsewhere, [ 23–25,315–317 ] but the degree to which they are less, or more, able than EC‐AFM to study realistic batteries in relevant environments has not and hence will briefly be discussed.…”
Section: Challenges and Outlookmentioning
confidence: 99%
“…Finally, the variational problem at hand can be alternatively solved by the application of the minimum total complementary energy principle. Translation is related to the uniform elongation term u (1) 0 and thermal elongation α∆θ, while the rotation due to bending causes −w (2) (z − z 0 ). In the neutral surface, axial displacement due to rotation (and consequently strain due to bending) must vanish.…”
Section: Governing Potential For Beamsmentioning
confidence: 99%
“…In the present case, the shift of the neutral surface is not zero. The first and second derivative of the stress σ (1) , σ (2) now have nonlocal character, Eq. (10): (2) ).…”
Section: Beam Displacements Of Nonlocal Fg Beamsmentioning
confidence: 99%
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