2021
DOI: 10.1002/aenm.202101518
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Characterizing Batteries by In Situ Electrochemical Atomic Force Microscopy: A Critical Review

Abstract: Although lithium, and other alkali ion, batteries are widely utilized and studied, many of the chemical and mechanical processes that underpin the materials within, and drive their degradation/failure, are not fully understood. Hence, to enhance the understanding of these processes various ex situ, in situ and operando characterization methods are being explored. Recently, electrochemical atomic force microscopy (EC‐AFM), and related techniques, have emerged as crucial platforms for the versatile characterizat… Show more

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Cited by 51 publications
(25 citation statements)
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References 341 publications
(347 reference statements)
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“…[6] Different techniques such as focused-ion beam scanning electron microscopy (FIB-SEM), atomic force microscopy (AFM), and X-ray computed tomography (X-ray CT) have been employed to further elucidate the intrinsic link between electrode morphology and battery performance. [7][8][9][10][11] X-ray CT has garnered particular interest due to its non-destructive nature and multi-scale and in situ capabilities. The technique involves collecting 2D radiographs at different angular rotations and reconstructing these to 3D datasets whereby the resulting attenuation of the X-ray is inversely proportional to the contrast of the resulting image.…”
mentioning
confidence: 99%
“…[6] Different techniques such as focused-ion beam scanning electron microscopy (FIB-SEM), atomic force microscopy (AFM), and X-ray computed tomography (X-ray CT) have been employed to further elucidate the intrinsic link between electrode morphology and battery performance. [7][8][9][10][11] X-ray CT has garnered particular interest due to its non-destructive nature and multi-scale and in situ capabilities. The technique involves collecting 2D radiographs at different angular rotations and reconstructing these to 3D datasets whereby the resulting attenuation of the X-ray is inversely proportional to the contrast of the resulting image.…”
mentioning
confidence: 99%
“…Under the right experimental conditions, the process can produce data with a very fine surface topography, usually with a lateral resolution of 1–20 nm and a height resolution of 0.025 nm, as well as a range of data on the physical nature of the material, such as conductivity, magnetic, electrostatic fields, and adhesion. [ 36,37 ]…”
Section: Technical Introductionmentioning
confidence: 99%
“…Recently, many visualization methods based on atomic force microscopy (AFM) have been developed to analyze battery materials. The most important advantage of AFM is the simultaneous analysis of various material properties on the surface and topography with nanoscale spatial resolution . For example, Zhang et al visualized the evolution of SEI, including the change in the elastic modulus of the SEI, by in situ electrochemical AFM .…”
Section: Introductionmentioning
confidence: 99%