2014
DOI: 10.1021/jp4105757
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Etching Silicon with HF-H2O2-Based Mixtures: Reactivity Studies and Surface Investigations

Abstract: In semiconductor and photovoltaic industries numerous process steps deal with etching and silicon surface modification. The present study focuses on the reactivity of HF-H2O2-based mixtures toward silicon surfaces in a wide range of concentrations. The generally very moderate reactivity is investigated regarding kinetic aspects and the silicon dissolution reactions. The activation energy of silicon dissolution in HF-H2O2 mixtures is determined to be ∼50 kJ/mol, which supports a surface reaction controlled mech… Show more

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Cited by 70 publications
(64 citation statements)
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“…A solution of HOOH + HF does not etch Si at an appreciable rate, much less than 0.01 nm s À1 at the concentrations used in this study [46,47]. However, HOOH + HF is the most commonly used solution for MAE.…”
Section: Introductionmentioning
confidence: 83%
“…A solution of HOOH + HF does not etch Si at an appreciable rate, much less than 0.01 nm s À1 at the concentrations used in this study [46,47]. However, HOOH + HF is the most commonly used solution for MAE.…”
Section: Introductionmentioning
confidence: 83%
“…[9] For example, using the data of Gondek et al [10] and that of Ref. [9] For example, using the data of Gondek et al [10] and that of Ref.…”
mentioning
confidence: 99%
“…According to Equations (2) and (3), as a typical Si-etching chemical, HF removes the SiO 2 from the surface of the Si wafer and continues to react with the Si beneath the SiO 2 surface layer. H 2 O 2 is added as a catalyst in the second step to accelerate the etching [22]. The reaction of HF and Si results in two gases, H 2 and SiF 4 , while SiF 4 is dissolved in HF to form H 2 SiF 6 (Equation (5)), leaving only H 2 gaseous emission from the etching system.…”
Section: Gaseous Emissionsmentioning
confidence: 99%