2020
DOI: 10.4028/www.scientific.net/kem.843.90
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Epitaxially Grown Hexagonal Boron Nitride Films on Sapphire and Silicon Substrates

Abstract: Hexagonal boron nitride (hBN) films were epitaxially grown on (100)-Oriented silicon and c-plane sapphire (α-Al2O3) substrates via a low-pressure chemical vapor deposition (LPCVD) method with boron trichloride (BCl3) and ammonia (NH3) as the boron source and nitrogen source. Crystalline quality differences between hBN films grown on different substrates are studied and discussed by XPS, Raman spectroscopy, XRD and SEM characterizations. All the characterization results indicate that the sapphire substrate is m… Show more

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Cited by 5 publications
(6 citation statements)
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“…5(a) and (b) indicating B and N atoms in the films are sp 2 -hybridized. 7 As shown in Fig. 5(a), the B 1S peak at 190.2 eV corresponds to the B–N bond.…”
Section: Resultsmentioning
confidence: 93%
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“…5(a) and (b) indicating B and N atoms in the films are sp 2 -hybridized. 7 As shown in Fig. 5(a), the B 1S peak at 190.2 eV corresponds to the B–N bond.…”
Section: Resultsmentioning
confidence: 93%
“…45 All the grown h-BN films have higher phonon frequency than 1366 cm −1 , indicating that there is residual compressive stress in the films. 7,46 Fig. 3(e) shows the plots of E 2g FWHM and E 2g Raman shift versus m -miscut angle of sapphire.…”
Section: Resultsmentioning
confidence: 99%
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