1998
DOI: 10.4028/www.scientific.net/msf.264-268.45
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Enlargement of SiC Crystals: Defect Formation at the Interfaces

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Cited by 10 publications
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“…[5][6][7] As an illustration of this difference, Figure 1 shows an optical micrograph of a cross-section of a PVT crystal containing both types of voids.…”
Section: Introductionmentioning
confidence: 97%
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“…[5][6][7] As an illustration of this difference, Figure 1 shows an optical micrograph of a cross-section of a PVT crystal containing both types of voids.…”
Section: Introductionmentioning
confidence: 97%
“…Several authors have noted that thermal decomposition cavities originate at the interface between the SiC seed and the graphite seed holder. 4,7,8 Vodakov et al 7 proposed that thermal decomposition cavities form by a recrystallization process in which SiC is transported across small gaps or liquid droplets at the holder/SiC interface. Similarly, Anikin et al 8 suggested that they form by localized sublimation from the back of the relatively hot seed to a relatively cool graphite seed holder.…”
Section: Introductionmentioning
confidence: 99%
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“…Growth parameters like temperature, pressure, and supersaturation have a strong influence on the SiC polytype during the physical vapor transport (PVT) process. By adjusting these three factors, the growth characteristics of 4H and 6H SiC can be changed, and the transition between 4H-SiC and 6H-SiC can also be observed. Other factors such as impurities, surface types, offsets of the substrate, and atmospheric conditions are also important for the synthesis of SiC with a specific polytype in the PVT method. For SiC obtained by the chemical vapor deposition (CVD) method, 3C-SiC is the typical polytype . However, by proper selection of precursor and controlled synthesis parameters, 2H-SiC, 4H-SiC, and 6H-SiC can also be obtained. During the CVD process, the SiC polytype has a close relationship with the silicon-to-carbon (Si/C) ratio.…”
Section: Introductionmentioning
confidence: 99%