Enhanced Accuracy of Force Application for AFM Nanomanipulation Using Nonlinear Calibration of Optical Levers

Xie, Hui; Vitard, Julien; Haliyo, Sinan; Régnier, Stéphane

doi:10.1109/jsen.2008.920722

Cited by 18 publications

(13 citation statements)

References 35 publications

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“…One should be aware, that presented formulas describe an ideal case, while the nonlinear behavior of the photodiode should be taken into account, in particular, when the shift of the laser beam in respect to the central part of the photodiode is used to calculate the probe's displacement. The approach aiming at solving this limitation was reported by Xie et al [35]. The nonlinear calibration of the optical setup was performed for normal and lateral forces detection, after the spring constant for both directions was determined.…”

Section: The Probe's Deflection Detection Systemsmentioning

confidence: 99%

Quantitative Normal Force Measurements by Means of Atomic Force Microscopy Towards the Accurate and Easy Spring Constant Determination

Sikora¹

2016

NSNM

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Due to its rapid popularity increase within last three decades, with particular focus on submicrometer quantitative surface's properties imaging, atomic force microscopy (AFM) is still a subject of development and research in terms of both better understanding and efficient utilization of various measurement techniques. Quantitative and comparable measurements at nanoscale are a significant issue, as both: science and industry desire reliable results, allowing to perform repetitive experiments at any time and location. Therefore a numerous analysis and research projects were carried out to provide metrological approach for those techniques in terms of providing the traceability and the uncertainty estimation. In this paper an overview of various methods and approaches towards quantitative determination of the normal spring constant of the AFM probes is presented.

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Section: The Probe's Deflection Detection Systemsmentioning

confidence: 99%

Quantitative Normal Force Measurements by Means of Atomic Force Microscopy Towards the Accurate and Easy Spring Constant Determination

Sikora¹

2016

NSNM

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“…In experiments, cantilever's dimensions of beam length L, beam width wand tip height I are measured under an optical microscope. The beam thickness t is determined using forced oscillation method [26].…”

Section: Mechanics Of Fs-s Contactmentioning

confidence: 99%

Modeling and implementation of nanoscale robotic grasping

Xie

Lambert

Régnier

2011

2011 IEEE International Conference on Robotics and Automation

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Ahstract-To understand robotic grasping at the nanoscale, contact mechanics between nano grippers and nano samples was studied. Contact mechanics models were introduced to simulate elastic contacts between various profiles of flat surface, sphere and cylinder for different types of nano samples and nano grippers. Analyses and evaluation instances indicate that friction forces, commonly used in macro grasping to overcome the gravity, at nanoscale is often not enough to overcome relatively strong adhesion forces to pick up the nano sample deposited on a substrate due to tiny contact area of the grasping. Two-finger grippers are proposed for the stable nanoscale grasping and a nonparallel gripper with a 'V' configuration was demonstrated with better grasping capabilities than a parallel one. To achieve the robotic nanoscale grasping, a nano gripper constructed from two individually actuated and sensed tips is presented. Pick-and place manipulation of silicon nanowires validate the theoretical analyses and capabilities of the proposed nano gripper.

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“…This was then used to find the cantilever torsional spring constant in a similar manner to previous work. 31,32 Where possible the PSD signal was calibrated as the tip pushed against fixed particles, giving confidence in the tip's constant location. If this was not possible then the slope of friction loops was used as described by Liu et al 33 Further details may be found in Ref.…”

Section: A Experimentsmentioning

confidence: 99%

Selected immobilization of individual nanoparticles by spot-exposure electron-beam-induced deposition

et al. 2009

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The use of spot-exposure electron-beam-induced deposition (EBID) to immobilize targeted nanoparticles on a substrate is demonstrated, and investigated using experiment and simulation. Nanoparticles are secured in place through the build-up of carbonaceous material that forms in the region between a particle and substrate when an energetic electron beam is focused onto the particle and projected through to the substrate. Material build-up directly affects the strength of adhesion to the surface, and can be controlled through electron dosage and beam energy. By selectively immobilizing specific particles within surface agglomerations and removing the excess, we illustrate the potential for spot-exposure EBID as a new technique for nanofabrication.

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Enhanced Accuracy of Force Application for AFM Nanomanipulation Using Nonlinear Calibration of Optical Levers

Cited by 18 publications

References 35 publications

Quantitative Normal Force Measurements by Means of Atomic Force Microscopy Towards the Accurate and Easy Spring Constant Determination

Quantitative Normal Force Measurements by Means of Atomic Force Microscopy Towards the Accurate and Easy Spring Constant Determination

Modeling and implementation of nanoscale robotic grasping

Selected immobilization of individual nanoparticles by spot-exposure electron-beam-induced deposition

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