2014
DOI: 10.1109/tcsi.2014.2334891
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Energy/Reliability Trade-Offs in Low-Voltage ReRAM-Based Non-Volatile Flip-Flop Design

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Cited by 61 publications
(39 citation statements)
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“…In this work, we replace the scan-chain SRAMs (Fig. 5-a) in LUTs with NV scan-chain SRAMs borrowed from previous work [14]. The multiplexers in LUTs are still implemented by transmission gates to avoid endurance limitations of the RRAMs.…”
Section: B Rram-based Fpgas: Our Visionmentioning
confidence: 99%
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“…In this work, we replace the scan-chain SRAMs (Fig. 5-a) in LUTs with NV scan-chain SRAMs borrowed from previous work [14]. The multiplexers in LUTs are still implemented by transmission gates to avoid endurance limitations of the RRAMs.…”
Section: B Rram-based Fpgas: Our Visionmentioning
confidence: 99%
“…For this purpose, we consider a conventional master-slave flip-flop realized in CMOS technology and we enhance it with non-volatile storage [14]. The non-volatile data storage is realized thanks to two RRAM devices inserted in the sink of the cross-coupled inverter pair in the slave latch.…”
Section: A Rram-based Non-volatile Flip-flopmentioning
confidence: 99%
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“…In our vision of an RRAM-based FPGA, the scan-chain SRAMs of LUTs are replaced with a non-volatile version [15], while the SRAMs along with transmission-gates in programmable routing architectures evolve to RRAMs with programming schemes. When programmed into LRS, the RRAMs propagate the signals through the datapath and achieve a similar functionality as transmission-gates in on state.…”
Section: B Rram-based Fpga Architecturementioning
confidence: 99%