2018
DOI: 10.1038/s41563-018-0234-y
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Electric-field induced structural transition in vertical MoTe2- and Mo1–xWxTe2-based resistive memories

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Cited by 320 publications
(353 citation statements)
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“…In addition to electrode material, 2D materials could also be used as active layer to increase resistance of memristive devices [63] and reduce operating current. By inserting a tunneling barrier layer (i.e., Al 2 O 3 film) between MoTe 2 (6-36 nm) and electrode to suppress the tunneling current, Zhang shows excellent performance, such as an ON/OFF ratio of 10 5 to 10 6 ( Figure 2c), large nonlinearity at low resistance state (LRS), and high resistance state (HRS) resistance of larger than 10 TΩ.…”
Section: Power Consumptionmentioning
confidence: 99%
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“…In addition to electrode material, 2D materials could also be used as active layer to increase resistance of memristive devices [63] and reduce operating current. By inserting a tunneling barrier layer (i.e., Al 2 O 3 film) between MoTe 2 (6-36 nm) and electrode to suppress the tunneling current, Zhang shows excellent performance, such as an ON/OFF ratio of 10 5 to 10 6 ( Figure 2c), large nonlinearity at low resistance state (LRS), and high resistance state (HRS) resistance of larger than 10 TΩ.…”
Section: Power Consumptionmentioning
confidence: 99%
“…[53] Copyright 2014, John Wiley & Sons, Inc. b) Reproduced with permission. [63] Copyright 2019, Springer Nature Publishing AG. [63] Copyright 2019, Springer Nature Publishing AG.…”
Section: Device Reliabilitymentioning
confidence: 99%
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“…As of now, flash memory has also been occupying the main market share of the memory field; but the integration density of flash memory is facing its physical limit. Owing to its superior characteristics, random resistance access memory (RRAM) has also been regarded as a promising candidate for next‐generation nonvolatile memories …”
Section: Enhanced Electronic Device Performance By Ion Beammentioning
confidence: 99%
“…Power dissipation in 2D materials, including graphene, black phosphorus, and other TMDCs, has been studied by Raman spectroscopy under the high electrical fields applied to the FET structure 11,13–16. To the best of our knowledge, the power dissipation and electrical breakdown of molybdenum ditelluride (MoTe 2 ) have not been studied intensively, although it is one of the most promising TMDCs that can be employed for future 2D device applications requiring ambipolar semiconducting properties 17–20. MoTe 2 is known to have a 2H semiconducting phase with the thickness dependent band gap in the range from 0.83 to 1.1 eV 21,22.…”
Section: Introductionmentioning
confidence: 99%