Efficiency of oscillation-based BIST in 90nm CMOS active analog filters

Arbet, Daniel; Nagy, Gabriel; Stopjaková, Viera; Gyepes, Gábor

doi:10.1109/ddecs.2013.6549830

Cited by 6 publications

(4 citation statements)

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“…A fault detectability is defined as the sensitivity of oscillation frequency to variations of the component. To increase the detectability of catastrophic faults, the sensitivity of CUT oscillation frequency could be increased by manipulating one of component's value [10,12]. Manipulations of parameters in CUT means change of the initial circuit of the tested device, which can lead to non-guaranteed reliability of test results for the designed parameters.…”

Section: H(z)mentioning

confidence: 99%

“…Another way of maintaining oscillations at the output of the filter, as was described earlier, is to add a feedback circuit between the input and the output of the CUT. The feedback circuit is designed according to different types of filters [10]. For the low-pass filters, a positive feedback circuit is needed, which could be implemented with a high-gain inverter, zero-crossing detector, comparator or Schmitt trigger [5,27].…”

Section: H(z)mentioning

confidence: 99%

“…In other works, the oscillation based built-in self-test (OBIST) method has been implemented in low operating frequency filters [9], tested on discrete boards [5,6], thus implementation in CMOS technology has not been analyzed. In other studies, the proposed test method has been implemented in CMOS technology [10][11][12] and investigated on feedback circuit impedance matching [13], but investigation on different structures of filters and natural, non-pre-tuned fault estimation systems, is limited. It is also common to use fault tables [14] for pre-simulated systems, but this approach is not suitable when CUT is composed of large number of components or when there is a need for universal and easy implementation in different structure testing systems.…”

Section: Introductionmentioning

confidence: 99%

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Design of an Oscillation-Based BIST System for Active Analog Integrated Filters in 0.18 µm CMOS

2019

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In this paper, an oscillation-based built-in self-test system for active an analog integrated circuit is presented. This built-in self-test system was used to detect catastrophic and parametric faults, introduced during chip manufacturing. As circuits under test (CUT), second-order Sallen-Key, Akerberg-Mossberg and Tow-Thomas biquad filters were designed. The proposed test hardware detects parametric and catastrophic faults on changeable limits. The influence of both oscillation and test hardware on fault detection limits were investigated and analyzed. The proposed oscillation based self-test system was designed and simulated in 0.18 µm complementary metal-oxide semiconductor (CMOS) technology. Due to the easiness of implementation and configuration for testing of different active analog filters, such self-test systems can be effectively used in modern integrated circuits, made of a large number of devices and circuits, such as the multi-standard transceivers used in the core hardware of software-defined radios. Using the proposed test strategy, the fault tolerance limits for catastrophic faults varied from 96% to 100% for all injected faults in different structures of low pass filters (LPF). The detection range of parametric faults of passive components’ nominal value, depending on the used structure of the filter, did not exceed –0.74% – 0.72% in case of Sallen-Key, –3.31% – 1.00% in case of Akerberg-Mossberg and –2.39% – 1.44% in case of Tow-Thomas LPF.

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Section: H(z)mentioning

confidence: 99%

Section: H(z)mentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Design of an Oscillation-Based BIST System for Active Analog Integrated Filters in 0.18 µm CMOS

2019

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“…The fault free circuit is converted into an oscillator and simulated and its test parameter is thus derived. The different steps of the procedure are briefly given below [13][14].…”

Section: Testing Procedures For Obistmentioning

confidence: 99%

Analog and Mixed Signal Test Method based on OBIST Technique

KumarOjha¹,

Akashe²

2015

IJCA

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This paper describes a test method for analog and mixed signal device at very low cost and it"s based on OBIST (oscillation test) method. This method is built-in self test method appropriate for functional and structural testing of analog and mixed signal circuit. In test mode, the test circuit is converted into an oscillator. Then faults inside the test circuit that cause an affordable deviation of the oscillation frequency from its value are detected. Through this test method, no test vector is required to apply. Therefore in this test technique, the test vector generation drawbacks are eliminated and also the test time is reduced because limited number of oscillation frequencies is evaluated for each test circuit. This characteristic implies that Oscillation-test methodology is very attractive for further wafer-probe testing as final production testing. During this paper, the simulation results of this test method has been provided and verified throughout some examples like CMOS inverter and FET (field effect transistor).

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Investigation of feedback circuit for oscillation-based self-testing systems

Kladovščikov

Navickas

2019

2019 IEEE 7th IEEE Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE)

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Efficiency of oscillation-based BIST in 90nm CMOS active analog filters

Cited by 6 publications

References 6 publications

Design of an Oscillation-Based BIST System for Active Analog Integrated Filters in 0.18 µm CMOS

Design of an Oscillation-Based BIST System for Active Analog Integrated Filters in 0.18 µm CMOS

Analog and Mixed Signal Test Method based on OBIST Technique

Investigation of feedback circuit for oscillation-based self-testing systems

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