“…Then, heavily doped n þ a-IGZO at the S/D contact regions were formed by exposing NF 3 plasma with the self-align process, as shown in Figure S1c,d, Supporting Information. [28,[39][40][41][42][43] The gate of LTPS TFT and LT-GI/HT-GI stack layer was patterned by wet and dry etching, respectively, with a PR covered on the n-type TFT region, as shown in Figure 1l and Figure S2a,b, Supporting Information. The p þ LTPS regions for S/D ohmic contact were B doped using an ion doping system using the self-align process, [44][45][46] as shown in Figure S2c,d, Supporting Information.…”