Effect of dielectric barrier on rectification, injection and transport properties of printed organic diodes

Abstract

To cite this version:K E Lilja, H S Majumdar, K Lahtonen, P Heljo, S Tuukkanen, et al.. Effect of dielectric barrier on rectification, injection and transport properties of printed organic diodes. Journal of Physics D: Applied Physics, IOP Publishing, 2011, 44 (29) Author to whom any correspondence should be addressed.Abstract. Rectification ratios of 10 5 were observed in printed organic copper/polytriarylamine (PTAA)/silver diodes with a thin insulating barrier layer at the copper/PTAA interface. To clarify the origin of the high rectification ratio in the diodes, the injection, transport and structure of the diodes with two different copper cathodes were examined using impedance spectroscopy and X-ray photoelectron spectroscopy (XPS). The impedance data confirm that the difference in diode performance arises from the copper/PTAA interface. The XPS measurements show that the copper surface in both diode structures is covered by a layer of Cu 2 O topped by an organic layer. The organic layer is thicker on one of the surfaces, which results in lower reverse currents and higher rectification ratios in the printed diodes. We suggest a model where a dipole at the dual insulating layer induces a shift in the semiconductor energy levels explaining the difference between the diodes with different cathodes.

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