2001
DOI: 10.1063/1.1355006
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Effect of annealing time and temperature on the formation of threading and projected range dislocations in 1 MeV boron implanted Si

Abstract: The effect of as-implanted damage on the microstructure of threading dislocations in MeV implanted silicon

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Cited by 4 publications
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“…Similar observations were reported regarding the megaelectronvolts boron ion implantation induced dislocation, studied using TEM and etch pit density counts by Schimmel etching. 20,23,24 The Schimmel etching has a much faster etching rate of 1.5 m/min, as compared to the etching recipe used in this study ͑0.6 m/min͒. The etching depth can be more easily controlled using the slow etching rate recipe.…”
Section: Resultsmentioning
confidence: 96%
“…Similar observations were reported regarding the megaelectronvolts boron ion implantation induced dislocation, studied using TEM and etch pit density counts by Schimmel etching. 20,23,24 The Schimmel etching has a much faster etching rate of 1.5 m/min, as compared to the etching recipe used in this study ͑0.6 m/min͒. The etching depth can be more easily controlled using the slow etching rate recipe.…”
Section: Resultsmentioning
confidence: 96%